MC74AC125, MC74ACT125
www.onsemi.com
2
MAXIMUM RATINGS
Symbol Parameter Value Unit
V
CC
DC Supply Voltage *0.5 to )7.0 V
V
I
DC Input Voltage *0.5 v V
I
v V
CC
)0.5 V
V
O
DC Output Voltage (Note 1) *0.5 v V
O
v V
CC
)0.5 V
I
IK
DC Input Diode Current $20 mA
I
OK
DC Output Diode Current $50 mA
I
O
DC Output Sink/Source Current $50 mA
I
CC
DC Supply Current per Output Pin $50 mA
I
GND
DC Ground Current per Output Pin $50 mA
T
STG
Storage Temperature Range *65 to )150 °C
T
L
Lead temperature, 1 mm from Case for 10 Seconds 260 °C
T
J
Junction temperature under Bias )150 °C
q
JA
Thermal Resistance (Note 2) SOIC
TSSOP
125
170
°C/W
P
D
Power Dissipation in Still Air at 85°C SOIC
TSSOP
125
170
mW
MSL Moisture Sensitivity Level 1
F
R
Flammability Rating Oxygen Index: 30% − 35% UL 94 V−0 @ 0.125 in
V
ESD
ESD Withstand Voltage Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
> 2000
> 200
> 1000
V
I
Latch−Up
Latch−Up Performance Above V
CC
and Below GND at 85°C (Note 6) $100 mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. I
O
absolute maximum rating must be observed.
2. The package thermal impedance is calculated in accordance with JESD51−7.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Min Typ Max Unit
V
CC
Supply Voltage
′AC 2.0 5.0 6.0
V
′ACT 4.5 5.0 5.5
V
in
, V
out
DC Input Voltage, Output Voltage (Ref. to GND) 0 − V
CC
V
t
r
, t
f
Input Rise and Fall Time (Note 1)
′AC Devices except Schmitt Inputs
V
CC
@ 3.0 V − 150 −
V
CC
@ 4.5 V − 40 − ns/V
V
CC
@ 5.5 V − 25 −
T
J
Junction Temperature (PDIP) − − 140 °C
T
A
Operating Ambient Temperature Range −40 25 85 °C
I
OH
Output Current − HIGH − − −24 mA
I
OL
Output Current − LOW − − 24 mA
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
1. V
in
from 30% to 70% V
CC
; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. V
in
from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
