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CRB2A4E270JT

P1-P3P4-P6
6
Chip Resistor Arrays
CRB Series (Concave Type)
FEATURES
• Reduction in mounting
process & costs
• Save PCB space
• Reduction of inventory
control costs
APPLICATIONS
• Computer
• Hard Disk Drive
• Printer
• CD-ROM
Detailed specifications are available on request.
Packaging
T = Paper Taping
• CRB1A 10,000 pcs/7" reel
• CRB2A 10,000 pcs/7" reel
• CRB3A 5,000 pcs/7" reel
U = Plastic Taping
• CRB6A 4,000 pcs/7" reel
Resistance Tolerance
J = ±5%
G = ±2%
Blank = Chip Jumper Arrays
Resistance Value (3 digits)
Chip Jumper Arrays = 000
Series
Size
1A = 0606 size
2A = 0804 size
3A = 1206 size
6A = 2506 size
Number of
Elements
2E = 2 Elements
4E = 4 Elements
8E = 8 Elements
HOW TO ORDER
CRB 1A 2E 103 J T
Chip Resistor Arrays have several resistor elements
integrated as a single component.
RATING
Chip Resistor Arrays
Item Rating
Rated Power (70°C)* 1/16W Element
Max. Working Voltage 50V
Max. Overload Voltage 100V
Resistance Value 10Ω to 2.2MΩ (CRB6A 1MΩ max.)
Tolerance J±5% (CRB6A G ± 2% only)
Working Temperature -55 to +125°C
Chip Jumper Arrays
Item Rating
Rated Current 1A
Conductive
50MΩ max.
Resistance Value
Resistance Value
Zero ohms
(0 ± .5 ohms)
Working Temperature -55 to +125°C
*Rated voltage = 50V or Rated power x Resistance value, whichever is less
Code W L C d t a b P
Dim.
1.60±0.15 1.60±0.20 0.30±0.20 0.40±0.15 0.60±0.10 0.50±0.15 0.30±0.10 0.80±0.10
(0.063±0.006) (0.063±0.008) (0.012±0.008) (0.016±0.006) (0.024±0.006) (0.020±0.006) (0.012±0.004) (0.031±0.004)
Code L W T P c d
ee
(top) (bottom)
Dim.
6.40±0.20 1.60±0.20 0.60±0.10 0.80 typ 0.30±0.20 0.40±0.15 0.50±0.10 0.40±0.15
(0.252±0.008) (0.063±0.008) (0.024±0.004) (0.031 typ) (0.012±0.008) (0.016±0.006) (0.020±0.004) (0.016±0.006)
DIMENSIONS millimeters (inches)
CRB1A2E
No Marking on chips
L
C
W
T
d
P
e b
W
P
d
C
T
L
e
CRB2A4E
CRB6A8E
Code L W T P b c d e
Dim.
2.00±0.10 1.00±0.10 0.40±0.10 0.50 typ ø0.15 typ 0.20±0.15 0.25±0.015 0.25 typ
(0.079±0.004) (0.039±0.004) (0.016±0.004) (0.020 typ) (ø0.006 typ) (0.008±0.006) (0.010±0.006) (0.010 typ)
CRB3A4E
Code W L C D T P
Dim.
1.60±0.15 3.20±0.15 0.30±0.20 0.40±0.15 0.60±0.10 0.80 typ
(0.063±0.006) (0.126±0.006) (0.012±0.008) (0.016±0.006) (0.024±0.004) (0.031 typ)
R1 R2
R1=R2
R1 R2 R3
R1=R2=R3=R4=R5=R6=R7=R8
R4
R5 R6 R7
R8
8 Resistors Circuit
2 Resistors Circuit 4 Resistors Circuit
L
C
C
W
t
d
d
P
a
b
R1 R2 R3
R1=R2=R3=R4
R4
L
W
T
d
P
C
9
Item
Standard Test Conditions
Resistor Jumper Resistor Jumper
DC Resistance Within Initial Tolerance 50mΩ max.
Power Condition A
(20°C, 65% RH)
Test Temperature: 25, 125(°C)
R/R=R
2
–R
1
/R
1
x1/T
2
–T
1
x10
6
R/R = Temp. Coefficient
Temperature (ppm/°C)
Characteristics T
1
= 25(°C)
T
2
= 125(°C)
R
1
= T
1
Resistance at (Ω)
R
2
= T
2
Resistance at (Ω)
(1) Apply 2.0 x rated voltage for (1) 2A for 5 sec.
5 sec. (2.5 x rated voltage (CJ03 = 1A)
for Arrays) (2) Wait 30 minutes
(2) Wait 30 minutes (3) Measure
R/R ±(2.0%+0.10Ω) max. 50mΩ max. (3) Measure resistance resistance
Short-time of the initial value CR03 = 30V max.
Overload CR05 = 50V max
CR10 = 100V max.
CR21 = 200V max.
CR32 = 400V max.
Visual
No evidence of mechanical damage
CRA3A, CRB3A, CRC3A =
intermittent overload
100V max.
(1) Perform 10,000 voltage (1) Perform 10,000
cycles as follows: current cycles
ON (2.0 x rated voltage, as follows:
2.5 x for Arrays) 1 sec. ON (2A) 1 sec.
R/R ±(5%+0.1Ω) max. 50mΩ max. OFF 25 sec. OFF 25 sec.
Intermittent of the initial value (2) Stabilization time 30 min. (2) Wait 30 minutes
Overload without loading (3) Measure
(3) Measure resistance resistance
CR03 = 30V max. CJ03 = 1A max.
CR05 = 50V max.
CR10 = 150V max.
Visual No evidence of mechanical damage
CR21 = 200V max.
CR32 = 400V max.
CRA, CRB, CRC = 100V max.
Dielectric
No evidence of mechanical damage
Apply 500 VAC for 1 min. (CR10 300 VAC)
Withstanding Voltage
(CR05, CRA3A, CRB3A, CRC3A 300 VAC/1 sec.
CR03 50 VAC/min.)
• CR03, CJ03 = 10
8
Ω min.
• CR05, CJ05 = 10
8
Ω min.
Insulation Resistance • CR10, CJ10 = 10
9
Ω min.
• CR21, CJ21 = 10
10
Ω min.
Apply 500V DC• CR32, CJ32 = 10
12
Ω min.
(CR05, CRA3A, CRB3A, CRC3A 100V DC• CRA3A, CRB3A, CRC3A = 10
9
Ω min.
CR03 50 VDC)
Chip Resistor Arrays
CR, CJ, CRA, CRB, CRC Series - Test Conditions
ELECTRICAL CHARACTERISTICS
Resistance (Ω) TCR (ppm/°C)
*D, F
10≤ R ≤1M –100 to +100
J, CR05 = F
R <10 –100 to +600
10≤ R ≤1M –250 to +250
1M< R –500 to +300
10
Chip Resistor Arrays
CR, CJ, CRA, CRB, CRC Series - Test Conditions
MECHANICAL CHARACTERISTICS
ENVIRONMENTAL CHARACTERISTICS
Item
Standard Test Conditions
Resistor Jumper Resistor Jumper
R/R
±(1%+0.05Ω) max. 50mΩ max. Apply the load as shown:
of the initial value Measure resistance during load application
Terminal
Strength
Visual No evidence of mechanical damage after loading
PC Board = Glass epoxy t = 1.60 (0.063)
Soldering
R/R
±(1%+0.05Ω) max. 50mΩ max. Immerse into molten solder at 260±5°C for 10±1 sec.
Heat of the initial value Stabilize component at room temperature for 1 hr.
Resistance
Visual No evidence of leaching
Measure resistance.
Solderability Coverage ≥95% each termination end
Immerse in Rogin Flux for 2±0.5 sec. and in
SN62 solder at 235±5°C for 2±0.5 sec.
Anti-Vibration
R/R
±(1%+0.1Ω) max. 50mΩ max. 2 hrs. each in X, Y and Z axis. (TTL 6 hrs.) 10 to 55 Hz
Test
of the initial value sweep in 1 min. at 1.5mm amplitude.
Visual No evidence of mechanical damage
Solvent
R/R
±(0.5%+0.05Ω) max. 50mΩ max.
Immerse in static state butyl acetate at 20°C to 25°C
for 30±5 sec.
Resistance
of the initial value
Stabilize component at room temperature for 30 min.
Visual No evidence of mechanical damage
then measure value.
millimeters (inches)
Item
Standard Test Conditions
Resistor Jumper Resistor Jumper
Temperature
R/R
±(1%+0.05Ω) max.
50mΩ max.
(1) Run 5 cycles as follows: -55±3°C for 30 min.
Cycle
of the initial value 125±3°C for 30 min. Room temp. for 10-15 min.
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
Low
R/R
±(2%+0.1Ω) max.
50mΩ max.
(1) Dwell in -55°C chamber without loading for 1000
Temperature
of the initial value hrs.
Storage
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
High
R/R
±(3%+0.1Ω) max.
50mΩ max.
(1) Dwell in 125°C chamber without loading for 1000
Temperature
of the initial value hrs.
Storage
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R
±(3%+0.1Ω) max. 50mΩ max. (1) Dwell in temp.: 65°C RH90 to 95% RH chamber
Moisture
of the initial value without loading for 1000 hrs.
Resistance
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R
±(3%+0.1Ω) max. 50mΩ max. (1) Temp.: 70±3°C Voltage: (rated voltage) on 90 min.
Life Test
of the initial value off 30 min. Duration: 1000 hrs.
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R
±(3%+0.1Ω) max. 50mΩ max. (1) Temp.: 40±2°C RH: 90-95% Voltage Cycle: on 90
Loading Life
of the initial value min. (rated voltage) off 30 min. Duration: 1000 hrs.
in Moisture
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
+48
-0
+48
-0
+48
-0
+48
-0
+48
-0
20
(0.787)
R230
50
(1.969)
3 (0.118)
[φ5 (0.197)]
45 (1.772) 45 (1.772)
±2 (0.079)max
Bending in
10 seconds
P1-P3P4-P6

CRB2A4E270JT

Mfr. #:
Buy CRB2A4E270JT
Manufacturer:
N/A
Description:
Resistor Networks & Arrays 27 Ohm 5%
Lifecycle:
New from this manufacturer.
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