10
Chip Resistor Arrays
CR, CJ, CRA, CRB, CRC Series - Test Conditions
MECHANICAL CHARACTERISTICS
ENVIRONMENTAL CHARACTERISTICS
Item
Standard Test Conditions
Resistor Jumper Resistor Jumper
R/R
±(1%+0.05Ω) max. 50mΩ max. Apply the load as shown:
of the initial value Measure resistance during load application
Terminal
Strength
Visual No evidence of mechanical damage after loading
PC Board = Glass epoxy t = 1.60 (0.063)
Soldering
R/R
±(1%+0.05Ω) max. 50mΩ max. Immerse into molten solder at 260±5°C for 10±1 sec.
Heat of the initial value Stabilize component at room temperature for 1 hr.
Resistance
Visual No evidence of leaching
Measure resistance.
Solderability Coverage ≥95% each termination end
Immerse in Rogin Flux for 2±0.5 sec. and in
SN62 solder at 235±5°C for 2±0.5 sec.
Anti-Vibration
R/R
±(1%+0.1Ω) max. 50mΩ max. 2 hrs. each in X, Y and Z axis. (TTL 6 hrs.) 10 to 55 Hz
Test
of the initial value sweep in 1 min. at 1.5mm amplitude.
Visual No evidence of mechanical damage
Solvent
R/R
±(0.5%+0.05Ω) max. 50mΩ max.
Immerse in static state butyl acetate at 20°C to 25°C
for 30±5 sec.
Resistance
of the initial value
Stabilize component at room temperature for 30 min.
Visual No evidence of mechanical damage
then measure value.
millimeters (inches)
Item
Standard Test Conditions
Resistor Jumper Resistor Jumper
Temperature
R/R
±(1%+0.05Ω) max.
50mΩ max.
(1) Run 5 cycles as follows: -55±3°C for 30 min.
Cycle
of the initial value 125±3°C for 30 min. Room temp. for 10-15 min.
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
Low
R/R
±(2%+0.1Ω) max.
50mΩ max.
(1) Dwell in -55°C chamber without loading for 1000
Temperature
of the initial value hrs.
Storage
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
High
R/R
±(3%+0.1Ω) max.
50mΩ max.
(1) Dwell in 125°C chamber without loading for 1000
Temperature
of the initial value hrs.
Storage
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R
±(3%+0.1Ω) max. 50mΩ max. (1) Dwell in temp.: 65°C RH90 to 95% RH chamber
Moisture
of the initial value without loading for 1000 hrs.
Resistance
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R
±(3%+0.1Ω) max. 50mΩ max. (1) Temp.: 70±3°C Voltage: (rated voltage) on 90 min.
Life Test
of the initial value off 30 min. Duration: 1000 hrs.
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R
±(3%+0.1Ω) max. 50mΩ max. (1) Temp.: 40±2°C RH: 90-95% Voltage Cycle: on 90
Loading Life
of the initial value min. (rated voltage) off 30 min. Duration: 1000 hrs.
in Moisture
Visual No evidence of mechanical damage
(2) Stabilize component at room temperature for 1 hr.
then measure value.
+48
-0
+48
-0
+48
-0
+48
-0
+48
-0