74HC_HCT4852_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 12 July 2012 12 of 21
NXP Semiconductors
74HC4852-Q100; 74HCT4852-Q100
Dual 4-channel analog multiplexer/demultiplexer with injection-current
effect control
Measurement points are given in Table 10.
Fig 11. Input (Sn) to output (nYn, nZ) propagation delays
001aah579
t
PLH
t
PHL
V
M
V
M
V
I
GND
Sn input
nYn or nZ
output
V
CC
GND
Measurement points are shown in Table 10.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 12. Enable and disable times
001aah580
t
PLZ
t
PHZ
switch OFF switch ON
V
Y
V
X
switch ON
nZ or nYn output
nZ or nYn output
E input
V
I
V
OL
V
OH
V
CC
V
M
V
M
0 V
GND
t
PZL
t
PZH
V
M
V
M
Table 10. Measurement points
Type Input Output
V
M
V
I
V
M
V
X
V
Y
74HC4852-Q100 0.5V
CC
V
CC
0.5V
CC
V
OL
+ 0.1(V
CC
V
OL
)0.9V
OH
74HCT4852-Q100 1.3 V 3.0 V 0.5V
CC
V
OL
+ 0.1(V
CC
V
OL
)0.9V
OH
74HC_HCT4852_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 12 July 2012 13 of 21
NXP Semiconductors
74HC4852-Q100; 74HCT4852-Q100
Dual 4-channel analog multiplexer/demultiplexer with injection-current
effect control
Fig 13. Test circuit for measuring power dissipation capacitance
001aah581
selected
channel
disabled
channel
V
CC
nYn
Sn
nYn
n.c.
nZ
GND
E
A
G
74HC_HCT4852_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 12 July 2012 14 of 21
NXP Semiconductors
74HC4852-Q100; 74HCT4852-Q100
Dual 4-channel analog multiplexer/demultiplexer with injection-current
effect control
[1] For 74HCT4852-Q100: input voltage V
I
= 3.0 V.
a. Input pulse definition
Definitions for test circuit:
R
L
= load resistance.
C
L
= load capacitance including jig and probe capacitance.
R
T
= termination resistance should be equal to the output impedance Z
o
of the pulse generator.
b. Load circuit
Test data is given in Table 11.
Fig 14. Input pulse definition and load circuit
001aac221
V
M
V
M
t
W
t
W
10 %
90 % 90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 % 10 %
t
f
t
r
t
r
t
f
001aaf883
V
CC
GND
V
I
V
O
V
CC
open
R
T
R
L
C
L
DUT
switch
G
Table 11. Test data
Test Input Output S1 position
Control E, Sn Switch nYn (nZ) t
r
, t
f
Switch nZ (nYn)
V
I
[1]
V
I
C
L
R
L
t
PHL,
t
PLH
V
CC
V
CC
6ns 50pF - open
t
PHZ
, t
PZH
V
CC
V
CC
6ns 50pF 10k GND
t
PLZ
, t
PZL
V
CC
V
CC
6ns 50pF 10k V
CC
C
PD
V
CC
V
CC
6ns 0 pF - open

74HCT4852BQ-Q100,1

Mfr. #:
Manufacturer:
Nexperia
Description:
Multiplexer Switch ICs 74HCT4852BQ-Q100/DHVQFN16/REEL
Lifecycle:
New from this manufacturer.
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