1
Features
• Low Voltage and Standard Voltage Operation
– 2.7 (V
CC
= 2.7V to 5.5V)
– 1.8 (V
CC
= 1.8V to 5.5V)
• Internally Organized 128 x 8
• Two-wire Serial Interface
• Bidirectional Data Transfer Protocol
• 400 kHz (1.8V) and 1 MHz (2.5V, 2.7V, 5V) Compatibility
• 4-Byte Page Write Mode
• Self-Timed Write Cycle (5 ms max)
• High Reliability
– Endurance: 1 Million Write Cycles
– Data Retention: 100 Years
• Automotive Grade, Extended Temperature and Lead-Free/Halogen-Free
Devices Available
• 8-lead PDIP, 8-lead JEDEC SOIC, 5-lead SOT23 and 8-lead TSSOP Packages
• Die Sales: Wafer Form, Waffle Pack, and Bumped Wafers
• Access to One Additional Page Upon Request
Description
The AT24C11 provides 1024 bits of serial electrically erasable and programmable
read only memory (EEPROM) organized as 128 words of 8 bits each. The device is
optimized for use in many industrial and commercial applications where low power
and low voltage operation are essential. The AT24C11 is available in space saving
8-lead PDIP, 8-lead JEDEC SOIC, 5-lead SOT23 and 8-lead TSSOP packages and is
accessed via a two-wire serial interface. In addition, the entire family is available in
2.7V (2.7V to 5.5V) and 1.8V (1.8V to 5.5V) versions.
Table 1. Pin Configuration
Pin Name Function
NC No Connect
SDA Serial Data
SCL Serial Clock Input
TEST Test Input (GND or VCC)
Two-wire Serial
EEPROM
1K (128 x 8)
AT24C11
Rev. 3409E–SEEPR–1/05
8-lead PDIP
1
2
3
4
8
7
6
5
NC
NC
NC
GND
VCC
TEST
SCL
SDA
8-lead SOIC
1
2
3
4
8
7
6
5
NC
NC
NC
GND
VCC
TEST
SCL
SDA
8-lead TSSOP
1
2
3
4
8
7
6
5
NC
NC
NC
GND
VCC
TEST
SCL
SDA
5-lead SOT23
1
2
3
5
4
SCL
GND
SDA
VCC
TEST