4©2016 Integrated Device Technology, Inc. Revison B, February 8, 2016
850S1201 Datasheet
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect product reliability.
DC Electrical Characteristics
Table 4A. Power Supply DC Characteristics, V
DD
= 3.3V ± 5%, T
A
= -40°C to 85°C
Table 4B. Power Supply DC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
Item Rating
Supply Voltage, V
DD
4.6V
Inputs, V
I
-0.5V to V
DD
+ 0.5V
Outputs, V
O
-0.5V to V
DD
+ 0.5V
Package Thermal Impedance,
JA
87.2C/W (0 mps)
Storage Temperature, T
STG
-65C to 150C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
DD
Positive Supply Voltage 3.135 3.3 3.465 V
I
DD
Power Supply Current Output Unterminated 49 mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
DD
Positive Supply Voltage 2.375 2.5 2.625 V
I
DD
Power Supply Current Output Unterminated 41 mA
5©2016 Integrated Device Technology, Inc. Revison B, February 8, 2016
850S1201 Datasheet
Table 4C. LVCMOS/LVTTL DC Characteristics, V
DD
= 3.3V ± 5% or 2.5V ± 5%, T
A
= -40°C to 85°C
NOTE 1: Output terminated with 50 to V
DD
/2. See Parameter Measurement Information section. Load Test Circuit diagrams.
AC Electrical Characteristics
Table 5A. AC Characteristics, V
DD
= 3.3V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input to V
DD
/2 of the output.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltage and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 3: This parameter is defined according with JEDEC Standard 65.
NOTE 4: Input duty cycle must be 50%.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input
High Voltage
V
DD
= 3.465V 2 V
DD
+ 0.3 V
V
DD
= 2.625V 1.7 V
DD
+ 0.3 V
V
IL
Input
Low Voltage
V
DD
= 3.465V -0.3 0.8 V
V
DD
= 2.625V -0.3 0.7 V
I
IH
Input
High Current
CLK[0:11],
CLK_SEL[0:3]
V
DD
= V
IN
= 3.465V or 2.625V 150 µA
OE V
DD
= V
IN
= 3.465V or 2.625V 10 µA
I
IL
Input
Low Current
CLK[0:11],
CLK_SEL[0:3]
V
DD
= 3.465V or 2.625V, V
IN
= 0V -10 µA
OE V
DD
= 3.465V or 2.625V, V
IN
= 0V -150 µA
V
OH
Output High Voltage; NOTE 1
V
DD
= 3.3V ± 5%, I
OH
= -12mA 2.6 V
V
DD
= 2.5V ± 5%, I
OH
= -12mA 1.8 V
V
OL
Output Low Voltage; NOTE 1
V
DD
= 3.3V ± 5% or 2.5V ± 5%,
I
OL
= 12mA
0.5 V
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency 250 MHz
tp
LH
Propagation Delay, Low-to-High;
NOTE 1
1.4 2.7 ns
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
155.52MHz, Integration
Range: 12kHz – 20MHz
0.35 ps
tsk(i) Input Skew 175 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 3 600 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 100 500 ps
odc Output Duty Cycle; NOTE 4
f 200MHz 46 54 %
f = 250MHz 40 60 %
MUX
ISOLATION
MUX Isolation 155.52MHz 43 dB
6©2016 Integrated Device Technology, Inc. Revison B, February 8, 2016
850S1201 Datasheet
Table 5B. AC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input to V
DD
/2 of the output.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltage and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 3: This parameter is defined according with JEDEC Standard 65.
NOTE 4: Input duty cycle must be 50%.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency 250 MHz
tp
LH
Propagation Delay, Low-to-High;
NOTE 1
1.5 2.7 ns
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
155.52MHz, Integration
Range: 12kHz – 20MHz
0.32 ps
tsk(i) Input Skew 195 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 3 600 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 80 600 ps
odc Output Duty Cycle; NOTE 4
f 200MHz 46 54 %
f = 250MHz 40 60 %
MUX
ISOLATION
MUX Isolation 155.52MHz 43 dB

850S1201BGILF

Mfr. #:
Manufacturer:
IDT
Description:
Clock Drivers & Distribution LVCMOS 12:1 MUX
Lifecycle:
New from this manufacturer.
Delivery:
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