Philips Semiconductors Preliminary data
XA-G49
XA 16-bit microcontroller family
64K Flash/2K RAM, watchdog, 2 UARTs
2001 Jun 27
37
t
UAWH
t
LLAX
ALE
MULTIPLEXED
ADDRESS
AND DATA
UNMULTIPLEXED
ADDRESS
WRL
or WRH
A4–A11 or A4–A15
DATA OUT
*
A0 or A1–A3, A12–A19
t
LLWL
t
WLWH
t
AVLL
t
AVWL
t
QVWX
t
WHQX
SU00584C
* DATA OUT is either D0–D7 or D0–D15, depending on the bus width (8 or 16 bits).
Figure 24. External Data Memory Write Cycle
XTAL1
ADDRESS BUS
WAIT
SU00709A
t
WTL
ALE
BUS STROBE
(WRL, WRH,
RD, OR PSEN)
t
WTH
t
CRAR
(The dashed line shows the strobe without WAIT.)
Figure 25. WAIT Signal Timing
Philips Semiconductors Preliminary data
XA-G49
XA 16-bit microcontroller family
64K Flash/2K RAM, watchdog, 2 UARTs
2001 Jun 27
38
V
DD
–0.5
0.45V
0.7V
DD
0.2V
DD
–0.1
t
CHCL
t
C
t
CLCH
t
CLCX
t
CHCX
SU00842
Figure 26. External Clock Drive
V
DD
–0.5
0.45V
0.2V
DD
+0.9
0.2V
DD
–0.1
NOTE:
AC inputs during testing are driven at V
DD
–0.5 for a logic ‘1’ and 0.45V for a logic ‘0’.
Timing measurements are made at the 50% point of transitions.
SU00703A
Figure 27. AC Testing Input/Output
V
LOAD
V
LOAD
+0.1V
V
LOAD
–0.1V
V
OH
–0.1V
V
OL
+0.1V
NOTE:
TIMING
REFERENCE
POINTS
For timing purposes, a port is no longer floating when a 100mV change from load voltage occurs,
and begins to float when a 100mV change from the loaded V
OH
/V
OL
level occurs. I
OH
/I
OL
±20mA.
SU00011
Figure 28. Float Waveform
V
DD
EA
RST
XTAL1
XTAL2
V
SS
V
DD
(NC)
CLOCK SIGNAL
SU00591B
Figure 29. I
DD
Test Condition, Active Mode
All other pins are disconnected
V
DD
EA
RST
XTAL1
XTAL2
V
SS
V
DD
(NC)
CLOCK SIGNAL
SU00590B
V
DD
Figure 30. I
DD
Test Condition, Idle Mode
All other pins are disconnected
Philips Semiconductors Preliminary data
XA-G49
XA 16-bit microcontroller family
64K Flash/2K RAM, watchdog, 2 UARTs
2001 Jun 27
39
SU00844
100
80
60
40
20
0
0102030
FREQUENCY (MHz)
CURRENT (mA)
5 15 25
MAX. I
DD
(ACTIVE)
MAX. I
DD
(IDLE)
120
Figure 31. I
DD
vs. Frequency
Valid only within frequency specification of the device under test.
V
DD
–0.5
0.45V
0.7V
DD
0.2V
DD
–0.1
t
CHCL
t
CL
t
CLCH
t
CLCX
t
CHCX
SU00608A
Figure 32. Clock Signal Waveform for I
DD
Tests in Active and Idle Modes
t
CLCH
= t
CHCL
= 5ns
V
DD
EA
RST
XTAL1
XTAL2
V
SS
(NC)
SU00585A
V
DD
V
DD
Figure 33. I
DD
Test Condition, Power Down Mode
All other pins are disconnected. V
DD
=2 V to 5.5 V

PXAG49KBBD/00,557

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC MCU 16BIT 64KB FLASH 44LQFP
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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