NCP170AXV250GEVB Datasheet NCP170AXV250GEVB | P1-P3

11/10/15 1 www.onsemi.com

Test Procedure for the NCP170AXV250GEVB Evaluation Board

Test procedure:

1.Check the position of jumper and correct this if necesary in acordance with the picture above.

2. Connect the test setup as shown Figure above

3. Appy an input voltage Vin = 3.5 V

4. Appy Iout = 0mA load.

5. Check that Vout is 2.5 V +/-1%.

6. Increase Iout up to 0.15 A

7. Check that Vout is 2.5 V +/-1%.

7. Increase Vin up to 5.5 V and decrease the load in accordance with SOA

8. Power down the Load

9. Power down the Vcc

10. End of test

Mfr. #:

Manufacturer:

ON Semiconductor

Description:

Power Management IC Development Tools EVAL BRD FOR SOT563 PAC

Lifecycle:

New from this manufacturer.

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