7
FN6481.0
April 24, 2008
Schottky diode that is used in some systems for protecting
the load from reversed output voltage events.
In addition, more than 400mV hysteresis also incorporates
into the Tri-state shutdown window to eliminate PWM input
oscillations due to the capacitive load seen by the PWM
input through the body diode of the controller’s PWM output
when the power-up and/or power-down sequence of bias
supplies of the driver and PWM controller are required.
Power-On Reset (POR) Function
During initial start-up, the VCC voltage rise is monitored.
Once the rising VCC voltage exceeds 6.4V (typically),
operation of the driver is enabled and the PWM input signal
takes control of the gate drives. If VCC drops below the
falling threshold of 5.0V (typically), operation of the driver is
disabled.
Pre-POR Overvoltage Protection
Prior to VCC exceeding its POR level, the upper gate is held
low and the lower gate is controlled by the overvoltage
protection circuits. The upper gate driver is powered from
PVCC and will be held low when a voltage of 2.75V or higher
is present on PVCC as VCC surpasses its POR threshold.
The PHASE is connected to the gate of the low side
MOSFET (LGATE), which provides some protection to the
microprocessor if the upper MOSFET(s) is shorted during
start-up, normal, or shutdown conditions. For complete
protection, the low side MOSFET should have a gate
threshold well below the maximum voltage rating of the
load/microprocessor.
Internal Bootstrap Device
Both drivers feature an internal bootstrap Schottky diode.
Simply adding an external capacitor across the BOOT and
PHASE pins completes the bootstrap circuit. The bootstrap
function is also designed to prevent the bootstrap capacitor
from overcharging due to the large negative swing at the
trailing-edge of the PHASE node. This reduces voltage
stress on the boot to phase pins.
The bootstrap capacitor must have a maximum voltage
rating above PVCC + 5V and its capacitance value can be
chosen from Equation 1:
where Q
G1
is the amount of gate charge per upper MOSFET at
V
GS1
gate-source voltage and N
Q1
is the number of control
MOSFETs. The ΔV
BOOT_CAP
term is defined as the allowable
droop in the rail of the upper gate drive.
As an example, suppose two IRLR7821 FETs are chosen as
the upper MOSFETs. The gate charge, Q
G
, from the data
sheet is 10nC at 4.5V (V
GS
) gate-source voltage. Then the
Q
GATE
is calculated to be 53nC for PVCC = 12V. We will
assume a 200mV droop in drive voltage over the PWM
cycle. We find that a bootstrap capacitance of at least
0.267µF is required. The next larger standard value
capacitance is 0.33µF. A good quality ceramic capacitor is
recommended.
Gate Drive Voltage Versatility
The ISL6615 provides the user with flexibility in choosing the
gate drive voltage for efficiency optimization. The ISL6615
ties the upper and lower drive rails together. Simply applying
a voltage from +4.5V up to 13.2V on PVCC sets both gate
drive rail voltages simultaneously, while VCC’s operating
range is from +6.8V up to 13.2V.
Power Dissipation
Package power dissipation is mainly a function of the
switching frequency (F
SW
), the output drive impedance, the
external gate resistance, and the selected MOSFET’s
internal gate resistance and total gate charge. Calculating
the power dissipation in the driver for a desired application is
critical to ensure safe operation. Exceeding the maximum
allowable power dissipation level will push the IC beyond the
maximum recommended operating junction temperature of
+125°C. The maximum allowable IC power dissipation for
the SO8 package is approximately 800mW at room
temperature, while the power dissipation capacity in the DFN
package, with an exposed heat escape pad, is more than
1.5W. The DFN package is more suitable for high frequency
applications. See “Layout Considerations” on page 8 for
thermal transfer improvement suggestions. When designing
the driver into an application, it is recommended that the
following calculation is used to ensure safe operation at the
desired frequency for the selected MOSFETs. The total gate
drive power losses due to the gate charge of MOSFETs and
the driver’s internal circuitry and their corresponding average
driver current can be estimated with Equations 2 and 3,
respectively.
C
BOOT_CAP
Q
GATE
ΔV
BOOT_CAP
--------------------------------------
Q
GATE
Q
G1
PVCC
V
GS1
------------------------------------
N
Q1
=
(EQ. 1)
50nC
20nC
FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE
VOLTAGE
ΔV
BOOT_CAP
(V)
C
BOOT_CAP
(µF)
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0.30.0 0.1 0.2 0.4 0.5 0.6 0.90.7 0.8 1.0
Q
GATE
= 100nC
ISL6615
8
FN6481.0
April 24, 2008
where the gate charge (Q
G1
and Q
G2
) is defined at a
particular gate to source voltage (V
GS1
and V
GS2
) in the
corresponding MOSFET datasheet; I
Q
is the driver’s total
quiescent current with no load at both drive outputs; N
Q1
and N
Q2
are the number of upper and lower MOSFETs,
respectively; PVCC is the drive voltage for both upper and
lower FETs. The I
Q
*VCC product is the quiescent power of
the driver without capacitive load and is typically 200mW at
300kHz and VCC = PVCC = 12V.
The total gate drive power losses are dissipated among the
resistive components along the transition path. The drive
resistance dissipates a portion of the total gate drive power
losses, the rest will be dissipated by the external gate
resistors (R
G1
and R
G2
) and the internal gate resistors
(R
GI1
and R
GI2
) of MOSFETs. Figures 3 and 4 show the
typical upper and lower gate drives turn-on transition path.
The power dissipation on the driver can be roughly
estimated, as shown in Equation 4.
Application Information
Layout Considerations
The parasitic inductances of the PCB and of the power
devices’ packaging (both upper and lower MOSFETs) can
cause serious ringing, exceeding the device’s absolute
maximum ratings. A good layout helps reduce the ringing on
the switching node (PHASE) and significantly lowers the
stress applied to the output drives. The following advice is
meant to lead to an optimized layout and performance:
Keep decoupling loops (VCC-GND, PVCC-GND and
BOOT-PHASE) short and wide (at least 25 mils). Avoid
using vias on decoupling components other than their
ground terminals, which should be on a copper plane with
at least two vias.
Minimize trace inductance, especially on low-impedance
lines. All power traces (UGATE, PHASE, LGATE, GND,
PVCC, VCC, GND) should be short and wide (at least
25 mils). Try to place power traces on a single layer,
otherwise, two vias on interconnection are preferred
where possible. For no connection (NC) pins on the QFN
part, connect it to the adjacent net (LGATE2/PHASE2) can
reduce trace inductance.
P
Qg_TOT
P
Qg_Q1
P
Qg_Q2
I
Q
VCC++=
(EQ. 2)
P
Qg_Q1
Q
G1
PVCC
2
V
GS1
---------------------------------------
F
SW
N
Q1
=
P
Qg_Q2
Q
G2
PVCC
2
V
GS2
---------------------------------------
F
SW
N
Q2
=
I
DR
Q
G1
PVCC N
Q1
V
GS1
-----------------------------------------------------
Q
G2
PVCC N
Q2
V
GS2
-----------------------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
F
SW
I
Q
+=
(EQ. 3)
P
DR
P
DR_UP
P
DR_LOW
I
Q
VCC++=
(EQ. 4)
P
DR_UP
R
HI1
R
HI1
R
EXT1
+
--------------------------------------
R
LO1
R
LO1
R
EXT1
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q1
2
---------------------
=
P
DR_LOW
R
HI2
R
HI2
R
EXT2
+
--------------------------------------
R
LO2
R
LO2
R
EXT2
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q2
2
---------------------
=
R
EXT1
R
G1
R
GI1
N
Q1
-------------
+= R
EXT2
R
G2
R
GI2
N
Q2
-------------
+=
FIGURE 3. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
FIGURE 4. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
Q1
D
S
G
R
GI1
R
G1
BOOT
R
HI1
C
DS
C
GS
C
GD
R
LO1
PHASE
PVCC
PVCC
Q2
D
S
G
R
GI2
R
G2
R
HI2
C
DS
C
GS
C
GD
R
LO2
ISL6615
9
FN6481.0
April 24, 2008
Shorten all gate drive loops (UGATE-PHASE and
LGATE-GND) and route them closely spaced.
Minimize the inductance of the PHASE node. Ideally, the
source of the upper and the drain of the lower MOSFET
should be as close as thermally allowable.
Minimize the current loop of the output and input power
trains. Short the source connection of the lower MOSFET
to ground as close to the transistor pin as feasible. Input
capacitors (especially ceramic decoupling) should be
placed as close to the drain of upper and source of lower
MOSFETs as possible.
Avoid routing relatively high impedance nodes (such as
PWM and ENABLE lines) close to high dV/dt UGATE and
PHASE nodes.
In addition, for heat spreading, place copper underneath the
IC whether it has an exposed pad or not. The copper area
can be extended beyond the bottom area of the IC and/or
connected to buried power ground plane(s) with thermal
vias. This combination of vias for vertical heat escape,
extended copper plane, and buried planes for heat
spreading allows the IC to achieve its full thermal potential.
Upper MOSFET Self Turn-On Effects at Start-up
Should the driver have insufficient bias voltage applied, its
outputs are floating. If the input bus is energized at a high
dV/dt rate while the driver outputs are floating, due to the
self-coupling via the internal C
GD
of the MOSFET, the
UGATE could momentarily rise up to a level greater than the
threshold voltage of the MOSFET. This could potentially turn
on the upper switch and result in damaging inrush energy.
Therefore, if such a situation (when input bus powered up
before the bias of the controller and driver is ready) could
conceivably be encountered, it is a common practice to
place a resistor (R
UGPH
) across the gate and source of the
upper MOSFET to suppress the Miller coupling effect. The
value of the resistor depends mainly on the input voltage’s
rate of rise, the C
GD
/C
GS
ratio, as well as the gate-source
threshold of the upper MOSFET. A higher dV/dt, a lower
C
DS
/C
GS
ratio, and a lower gate-source threshold upper
FET will require a smaller resistor to diminish the effect of
the internal capacitive coupling. For most applications, the
integrated 20kΩ typically sufficient, not affecting normal
performance and efficiency.
The coupling effect can be roughly estimated with the
formulas in Equation 5, which assume a fixed linear input
ramp and neglect the clamping effect of the body diode of
the upper drive and the bootstrap capacitor. Other parasitic
components such as lead inductances and PCB
capacitances are also not taken into account. These
equations are provided for guidance purpose only.
Therefore, the actual coupling effect should be examined
using a very high impedance (10MΩ or greater) probe to
ensure a safe design margin.
V
GS_MILLER
dV
dt
-------
RC
rss
1e
V
DS
dV
dt
-------
RC
iss
----------------------------------
⎝⎠
⎜⎟
⎜⎟
⎜⎟
⎜⎟
⎛⎞
⋅⋅=
RR
UGPH
R
GI
+=
C
rss
C
GD
=
C
iss
C
GD
C
GS
+=
(EQ. 5)
FIGURE 5. GATE-TO-SOURCE RESISTOR TO REDUCE
UPPER MOSFET MILLER COUPLING
VIN
Q
UPPER
D
S
G
R
GI
R
UGPH
BOOT
DU
C
DS
C
GS
C
GD
DL
PHASE
PVCC
ISL6615
C
BOOT
UGATE
ISL6615

ISL6615CRZ

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Gate Drivers SPIN OF ISL6594D 2X DRIVE 3 3V PWM LOGIC
Lifecycle:
New from this manufacturer.
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