N57M5114
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4
Table 2. OPERATION MODES
INC CS U/D Operation
High to Low Low High Wiper toward H
High to Low Low Low Wiper toward L
High Low to High X Store Wiper Position
Low Low to High X No Store, Return to Standby
X High X Standby
Figure 4. Potentiometer Equivalent Circuit
C
W
R
L
C
L
C
H
R
W
R
WI
R
H
Table 3. ABSOLUTE MAXIMUM RATINGS
Parameters Ratings Units
Supply Voltage
V
CC
to GND −0.5 to +7
V
Inputs
CS
to GND −0.5 to V
CC
+0.5
V
INC to GND −0.5 to V
CC
+0.5 V
U/D to GND −0.5 to V
CC
+0.5 V
H to GND −0.5 to V
CC
+0.5 V
L to GND −0.5 to V
CC
+0.5 V
W to GND −0.5 to V
CC
+0.5 V
Operating Ambient Temperature
Industrial (‘I’ suffix)
−40 to +85
°C
Junction Temperature +150 °C
Storage Temperature −65 to 150 °C
Lead Soldering (10 s max) +300 °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
Table 4. RELIABILITY CHARACTERISTICS
Symbol Parameter Test Method Min Typ Max Units
V
ZAP
(Note 1) ESD Susceptibility MIL−STD−883, Test Method 3015 2000 V
I
LTH
(Notes 1, 2) Latch-up JEDEC Standard 17 100 mA
T
DR
Data Retention MIL−STD−883, Test Method 1008 100 Years
N
END
Endurance MIL−STD−883, Test Method 1033 1,000,000 Stores
1. This parameter is tested initially and after a design or process change that affects the parameter.
2. Latch-up protection is provided for stresses up to 100 mA on address and data pins from −1 V to V
CC
+ 1 V.
