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74ABT16245
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Note 3: Guaranteed, but not tested.
Storage Temperature 65 C to 150 C
Ambient Temperature under Bias
55 C to 125 C
Junction Temperature under Bias
55 C to 150 C
V
CC
Pin Potential to Ground Pin 0.5V to 7.0V
Input Voltage (Note 2)
0.5V to 7.0V
Input Current (Note 2)
30 mA to 5.0 mA
Voltage Applied to Any Output
in the Disabled or
Power-Off State
0.5V to 5.5V
in the HIGH State
0.5V to V
CC
Current Applied to Output
in LOW State (Max) twice the rated I
OL
(mA)
DC Latchup Source Current
500 mA
Over Voltage Latchup (I/O) 10V
Free Air Ambient Temperature
40 C to 85 C
Supply Voltage
4.5V to 5.5V
Minimum Input Edge Rate (
V/ t)
Data Input 50 mV/ns
Enable Input 20 mV/ns
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized LOW Signal
V
CD
Input Clamp Diode Voltage 1.2 V Min I
IN
18 mA (OE
n
, T/R
n
)
V
OH
Output HIGH Voltage 2.5 V Min I
OH
3 mA (A
n
, B
n
)
2.0 V Min I
OH
32 mA (A
n
, B
n
)
V
OL
Output LOW Voltage 0.55 V Min I
OL
64 mA (A
n
, B
n
)
I
IH
Input HIGH Current 1 AMaxV
IN
2.7V (OE
n
, T/R
n
) (Note 3)
1V
IN
V
CC
(OE
n
, T/R
n
)
I
BVI
Input HIGH Current Breakdown Test 7 AMaxV
IN
7.0V (OE
n
, T/R
n
)
I
BVIT
Input HIGH Current Breakdown Test (I/O) 100 AMaxV
IN
5.5V (A
n
, B
n
)
I
IL
Input LOW Current 1 AMaxV
IN
0.5V (OE
n
, T/R
n
) (Note 3)
1V
IN
0.0V (OE
n
, T/R
n
)
V
ID
Input Leakage Test 4.75 V 0.0 I
ID
1.9 A (OE
n
, T/R
n
)
All Other Pins Grounded
I
IH
I
OZH
Output Leakage Current 10 A0 5.5V V
OUT
2.7V (A
n
, B
n
); OE 2.0V
I
IL
I
OZL
Output Leakage Current 10 A0 5.5V V
OUT
0.5V (A
n
, B
n
); OE 2.0V
I
OS
Output Short-Circuit Current 100 275 mA Max V
OUT
0.0V (A
n
, B
n
)
I
CEX
Output HIGH Leakage Current 50 AMaxV
OUT
V
CC
(A
n
, B
n
)
I
ZZ
Bus Drainage Test 100 A0.0V
OUT
5.50V (A
n
, B
n
);
All Others GND
I
CCH
Power Supply Current 100 A Max All Outputs HIGH
I
CCL
Power Supply Current 60 mA Max All Outputs LOW
I
CCZ
Power Supply Current 100 AMaxOE
n
V
CC
, T/R
n
GND or V
CC
All others at V
CC
or GND
I
CCT
Additional I
CC
/Input Outputs Enabled 2.5 mA V
I
V
CC
2.1V
Outputs 3-STATE 2.5 mA Max OE
n
, T/ R
n
V
I
V
CC
2.1V
Outputs 3-STATE 50 A Data Input V
I
V
CC
2.1V
All others at V
CC
or GND
I
CCD
Dynamic I
CC
No Load mA/ Max Outputs OPEN
(Note 3) 0.1 MHz OE
n
GND, T/R
n
GND or V
CC
One Bit Toggling, 50% Duty Cycle
