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5
TVS DIODE ARRAYS
TVS Diode Arrays
SP721
Electronic Protection Array for ESD and Overvoltage Protection
Peak Transient Current Capability of the SP721
The peak transient current capability rises sharply as the width of the
current pulse narrows. Destructive testing was done to fully evaluate the
SP721’s ability to withstand a wide range of peak current pulses vs time.
The circuit used to generate current pulses is shown in Figure 5.
The test circuit of Figure 5 is shown with a positive pulse input. For a
negative pulse input, the (-) current pulse input goes to an SP721 ‘IN’
input pin and the (+) current pulse input goes to the SP721 V- pin. The
V+ to V- supply of the SP721 must be allowed to float. (i.e., It is not tied
to the ground reference of the current pulse generator.) Figure 6 shows
the point of overstress as defined by increased leakage in excess of the
data sheet published limits.
The maximum peak input current capability is dependent on the ambient
temperature, improving as the temperature is reduced. Peak current
curves are shown for ambient temperatures of 25
o
C and 105
o
C and a 15V
power supply condition.The safe operating range of the transient peak
current should be limited to no more than 75% of the measured over-
stress level for any given pulse width as shown in the curves of Figure 6.
Note that adjacent input pins of the SP721 may be paralleled to improve
current (and ESD) capability. The sustained peak current capability is
increased to nearly twice that of a single pin.
0.001 0.01 0.1 1
PULSE WIDTH TIME (ms)
PEAK CURRENT (A)
10
7
6
5
4
3
2
1
0
T
A
= 105
o
C
100 1000
CAUTION: SAFE OPERATING CONDITIONS LIMIT
OF THE VALUES SHOWN ON EACH CURVE.
PULSE WIDTH TO BE NO GREATER THAN 75%
THE MAXIMUM PEAK CURRENT FOR A GIVEN
V+ TO V- SUPPLY = 15V
T
A
= 25
o
C
FIGURE 6. SP721 TYPICAL SINGLE PULSE PEAK CURRENT CURVES SHOWING THE MEASURED POINT OF OVERSTRESS IN
AMPERES vs PULSE WIDTH TIME IN MILLISECONDS
