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DS1021S-25+

P1-P3P4-P6P7-P9
DS1021
4 of 9
CASCADING MULTIPLE DEVICES (DAISY CHAIN) Figure 3
PART NUMBER TABLE Table 1
DELAYS AND TOLERANCES (IN ns)
PART NUMBER STEP ZERO
DELAY TIME
MAX DELAY
TIME (NOM)
DELAY CHANGE
PER STEP (NOM)
MAX DEVIATION FROM
PROGRAMMED DELAY
DS1020-25 10 ± 2 73.75 0.25 ±6
DS1020-50 10 ± 2 137.5 0.5 ±8
DELAY VS. PROGRAMMED VALUE Table 2
MIN
DELAY
(STEP ZERO)
MAX
DELAY
PARALLEL
PORT
SERIAL
PORT
000000 111P7MSB
000000 111P6
BINARY
PROGRAMMED
VALUE
000000 111P5
000000 111P4
000000 111P3
000011 111P2
001100 011P1
PART
NUMBER
010101 101P0LSB
DS1021-25 10.00 10.25 10.50 10.75 11.00 11.25 73.25 73.50 73.75
DS1021-50 10.0 10.5 11.0 11.5 12.0 12.5 136.5 137.0 137.5
All delays in nanoseconds, referenced to input pin.
∬
DS1021
DS1021
DS1021
∬
DS1021
5 of 9
DALLAS SEMICONDUCTOR TEST CIRCUIT Figure 4
TEST SETUP DESCRIPTION
Figure 4 illustrates the hardware configuration used for measuring the timing parameters of the DS1021.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected to the output. The DS1021 serial and
parallel ports are controlled by interfaces to a central computer. All measurements are fully automated
with each instrument controlled by the computer over an IEEE 488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature: 25°C ± 3°C
Supply Voltage (V
CC
): 5.0V ± 0.1V
Input Pulse: High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50 ohms max.
Rise and Fall Time: 3.0 ns max.
(measured between 0.6V and 2.4V)
Pulse Width: 500 ns (DS1021–25)
2 µs (DS1021–50)
Period: 1 µs (DS1021–25)
4 µs (DS1021–50)
NOTE: Above conditions are for test only and do not restrict the operation of the device under other data
sheet conditions.
OUTPUT:
Output is loaded with a 74F04. Delay is measured between the 1.5V level of the rising edge of the input
signal and the 1.5V level of the corresponding edge of the output.
DS1021
DS1021
6 of 9
ABSOLUTE MAXIMUM RATINGS*
Voltage on Any Pin Relative to Ground -1.0V to +7.0V
Operating Temperature 0°C to 70°C
Storage Temperature -55°C to +125°C
Soldering Temperature 260°C for 10 seconds
Short Circuit Output Current 50 mA for 1 second
* This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operation sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of time may affect reliability.
DC ELECTRICAL CHARACTERISTICS (0°C to 70°C; V
CC
= 5.0V ± 5%)
PARAMETER SYM TEST
CONDITION
MIN TYP MAX UNITS NOTES
Supply Voltage V
CC
4.75 5.00 5.25 V 1
High Level Input
Voltage
V
IH
2.2 V
CC
+ 0.5 V 1
Low Level Input
Voltage
V
IL
-0.5 0.8 V 1
Input Leakage
Current
I
1
0.0V ≤ V
I
≤ V
CC
-1.0 1.0 µA
Active Current I
CC
V
CC
=MAX;
Period=1 µs
30.0 mA 3
High Level Output
Current
I
OH
V
CC
=MIN.
V
OH
=2.7V
-1.0 mA
Low Level Output
Current
I
OL
V
CC
=MIN.
V
OL
=0.5V
8mA4
AC ELECTRICAL CHARACTERISTICS (0°C to 70°C; V
CC
= 5V ± 5%)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Clock Frequency f
C
10 MHz
Enable Width t
EW
50 ns Fig. 7, 8
Clock Width t
CW
50 ns Fig. 8
Data Setup to Clock t
DSC
30 ns Fig. 8
Data Hold from Clock t
DHC
10 ns Fig. 8
Data Setup to Enable t
DSE
30 ns Fig. 7
Data Hold from Enable t
DHE
20 ns Fig. 7
Enable to Serial
Output Valid
t
EQV
50 ns Fig. 8
Enable to Serial
Output High Z
t
EQZ
0 50 ns Fig. 8
Clock to Serial
Output Valid
t
CQV
50 ns Fig. 8
Clock to Serial
Output Invalid
t
CQX
10 ns Fig. 8
Enable Setup to Clock t
ES
50 ns Fig. 8
Enable Hold from Clock t
EH
50 ns Fig. 8
Parallel Input Valid
to Delay Valid
t
PDV
50 µs Fig. 6
P1-P3P4-P6P7-P9

DS1021S-25+

Mfr. #:
Buy DS1021S-25+
Manufacturer:
Maxim Integrated
Description:
Delay Lines / Timing Elements Programmable 8-Bit .25ns Delay Line
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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