74HC_HCT165_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 17 July 2012 12 of 21
NXP Semiconductors
74HC165-Q100; 74HCT165-Q100
8-bit parallel-in/serial out shift register
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 8. Parallel load (PL) pulse width, parallel load to output (Q7 or Q7) propagation delays, parallel load to clock
(CP) and clock enable (CE
) recovery time
mna988
PL
input
CE, CP
input
Q7 or Q7
output
t
PHL
t
W
t
rec
V
M
V
OH
V
I
GND
V
I
GND
V
OL
V
M
V
M
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 9. Data input (D7) to output (Q7 or Q7) propagation delays when PL is LOW
mna989
D7 input
Q7 output
Q7 output
t
PHL
t
PHL
V
M
V
OH
V
I
GND
V
OH
V
OL
V
OL
V
M
t
PLH
t
PLH
V
M
74HC_HCT165_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 17 July 2012 13 of 21
NXP Semiconductors
74HC165-Q100; 74HCT165-Q100
8-bit parallel-in/serial out shift register
The shaded areas indicate when the input is permitted to change for predictable output performance
Measurement points are given in Table 8
.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
(1) CE
may change only from HIGH-to-LOW while CP is LOW, see Section 1.
Fig 10. Waveforms showing set-up and hold times
t
h
t
su
t
su
t
h
t
W
V
M
V
M
GND
V
I
GND
V
I
DS input
t
su
V
M
mna990
GND
V
I
CP, CE input
CP, CE input
(1)
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 11. The set-up and hold times from the data inputs (Dn) to the parallel load input (PL)
mna991
Dn input
PL input
t
su
t
h
V
I
GND
V
I
GND
V
M
V
M
t
su
t
h
V
M
V
M
Table 8. Measurement points
Type Input Output
V
I
V
M
V
M
74HC165-Q100 V
CC
0.5V
CC
0.5V
CC
74HCT165-Q100 3 V 1.3 V 1.3 V
74HC_HCT165_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 17 July 2012 14 of 21
NXP Semiconductors
74HC165-Q100; 74HCT165-Q100
8-bit parallel-in/serial out shift register
Test data is given in Table 9.
Definitions for test circuit:
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including jig and probe capacitance.
R
L
= Load resistance.
S1 = Test selection switch
Fig 12. Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aad983
DUT
V
CC
V
CC
V
I
V
O
R
T
R
L
S1
C
L
open
G
Table 9. Test data
Type Input Load S1 position
V
I
t
r
, t
f
C
L
R
L
t
PHL
, t
PLH
74HC165-Q100 V
CC
6ns 15pF, 50 pF 1k open
74HCT165-Q100 3 V 6 ns 15 pF, 50 pF 1 k open

74HCT165D-Q100,118

Mfr. #:
Manufacturer:
Nexperia
Description:
Counter Shift Registers 74HCT165D-Q100/SO16/REEL 13" Q
Lifecycle:
New from this manufacturer.
Delivery:
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