MTA8ATF1G64AZ-2G3A1 Datasheet MTA8ATF1G64AZ-2G6E1, MTA8ATF1G64AZ-2G3A1, MTA8ATF1G64AZ-2G3B1 | P4-P6

Table 4: Pin Assignments (Continued)

288-Pin DDR4 UDIMM Front 288-Pin DDR4 UDIMM Back

Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol

24 V

60 CKE0 96 V

132 DM7_n/

DBI7_n,

168 DQ11 204 V

240 DQ37 276 V

25 DQ20 61 V

97 DQ32 133 NC 169 V

205 NC 241 V

277 DQS7_c

26 V

62 ACT_n 98 V

134 V

170 DQ21 206 V

242 DQ33 278 DQS7_t

27 DQ16 63 BG0 99 DM4_n/

DBI4_n,

135 DQ62 171 V

207 BG1 243 V

279 V

28 V

64 V

100 NC 136 V

172 DQ17 208 ALERT_n 244 DQS4_c 280 DQ63

29 DM2_n/

DBI2_n,

65 A12/BC_n 101 V

137 DQ58 173 V

209 V

245 DQS4_t 281 V

30 NC 66 A9 102 DQ38 138 V

174 DQS2_c 210 A11 246 V

282 DQ59

31 V

67 V

103 V

139 SA0 175 DQS2_t 211 A7 247 DQ39 283 V

32 DQ22 68 A8 104 DQ34 140 SA1 176 V

212 V

248 V

284 V

DDSPD

33 V

69 A6 105 V

141 SCL 177 DQ23 213 A5 249 DQ35 285 SDA

34 DQ18 70 V

106 DQ44 142 V

178 V

214 A4 250 V

286 V

35 V

71 A3 107 V

143 V

179 DQ19 215 V

251 DQ45 287 V

36 DQ28 72 A1 108 DQ40 144 NC 180 V

216 A2 252 V

288 V

8GB (x64, SR) 288-Pin DDR4 UDIMM

Pin Assignments

PDF: 09005aef86418d84

atf8c1gx64az.pdf – Rev. C 1/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Pin Descriptions

The pin description table below is a comprehensive list of all possible pins for DDR4

modules. All pins listed may not be supported on this module. See Functional Block Di-

agram for pins specific to this module.

Table 5: Pin Descriptions

Symbol Type Description

Ax Input Address inputs: Provide the row address for ACTIVATE commands and the column address for

READ/WRITE commands in order to select one location out of the memory array in the respec-

tive bank (A10/AP, A12/BC_n, WE_n/A14, CAS_n/A15, and RAS_n/A16 have additional functions;

see individual entries in this table). The address inputs also provide the op-code during the

MODE REGISTER SET command. A17 is only defined for x4 SDRAM.

A10/AP Input Auto precharge: A10 is sampled during READ and WRITE commands to determine whether an

auto precharge should be performed on the accessed bank after a READ or WRITE operation

(HIGH = auto precharge; LOW = no auto precharge). A10 is sampled during a PRECHARGE com-

mand to determine whether the precharge applies to one bank (A10 LOW) or all banks (A10

HIGH). If only one bank is to be precharged, the bank is selected by the bank group and bank

addresses.

A12/BC_n Input Burst chop: A12/BC_n is sampled during READ and WRITE commands to determine if burst

chop (on-the-fly) will be performed (HIGH = no burst chop; LOW = burst- chopped). See Com-

mand Truth Table in the DDR4 component data sheet.

ACT_n Input Command input: ACT_n defines the ACTIVATE command being entered along with CS_n. The

input into RAS_n/A16, CAS_n/A15, and WE_n/A14 are considered as row address A16, A15, and

A14. See Command Truth Table.

BAx Input Bank address inputs: Define the bank (with a bank group) to which an ACTIVATE, READ,

WRITE, or PRECHARGE command is being applied. Also determine which mode register is to be

accessed during a MODE REGISTER SET command.

BGx Input Bank group address inputs: Define the bank group to which a REFRESH, ACTIVATE, READ,

WRITE, or PRECHARGE command is being applied. Also determine which mode register is to be

accessed during a MODE REGISTER SET command. BG[1:0] are used in the x4 and x8 configura-

tions. x16-based SDRAM only has BG0.

C0, C1, C2

(RDIMM/LRDIMM on-

ly)

Input Chip ID: These inputs are used only when devices are stacked; that is, 2H, 4H, and 8H stacks for

x4 and x8 configurations using through-silicon vias (TSVs). These pins are not used in the x16

configuration. Some DDR4 modules support a traditional DDP package, which uses CS1_n,

CKE1, and ODT1 to control the second die. All other stack configurations, such as a 4H or 8H,

are assumed to be single-load (master/slave) type configurations where C0, C1, and C2 are used

as chip ID selects in conjunction with a single CS_n, CKE, and ODT. Chip ID is considered part of

the command code.

CKx_t

CKx_c

Input Clock: Differential clock inputs. All address, command, and control input signals are sampled

on the crossing of the positive edge of CK_t and the negative edge of CK_c.

CKEx Input Clock enable: CKE HIGH activates and CKE LOW deactivates the internal clock signals, device

input buffers, and output drivers. Taking CKE LOW provides PRECHARGE POWER-DOWN and

SELF REFRESH operations (all banks idle), or active power-down (row active in any bank). CKE is

asynchronous for self refresh exit. After V

REFCA

has become stable during the power-on and ini-

tialization sequence, it must be maintained during all operations (including SELF REFRESH). CKE

must be maintained HIGH throughout read and write accesses. Input buffers (excluding CK_t,

CK_c, ODT, RESET_n, and CKE) are disabled during power-down. Input buffers (excluding CKE

and RESET#) are disabled during self refresh.

CSx_n Input Chip select: All commands are masked when CS_n is registered HIGH. CS_n provides external

rank selection on systems with multiple ranks. CS_n is considered part of the command code

(CS2_n and CS3_n are not used on UDIMMs).

8GB (x64, SR) 288-Pin DDR4 UDIMM

Pin Descriptions

PDF: 09005aef86418d84

atf8c1gx64az.pdf – Rev. C 1/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Table 5: Pin Descriptions (Continued)

Symbol Type Description

ODTx Input On-die termination: ODT (registered HIGH) enables termination resistance internal to the

DDR4 SDRAM. When enabled, ODT (R

) is applied only to each DQ, DQS_t, DQS_c, DM_n/

DBI_n/TDQS_t, and TDQS_c signal for x4 and x8 configurations (when the TDQS function is ena-

bled via the mode register). For the x16 configuration, R

is applied to each DQ, DQSU_t,

DQSU_c, DQSL_t, DQSL_c, UDM_n, and LDM_n signal. The ODT pin will be ignored if the mode

registers are programmed to disable R

PARITY Input Parity for command and address: This function can be enabled or disabled via the mode

WE_n/A14, BG[1:0], BA[1:0], A[16:0]. Input parity should be maintained at the rising edge of the

clock and at the same time as command and address with CS_n LOW.

RAS_n/A16

CAS_n/A15

WE_n/A14

Input Command inputs: RAS_n/A16, CAS_n/A15, and WE_n/A14 (along with CS_n) define the com-

mand and/or address being entered and have multiple functions. For example, for activation

with ACT_n LOW, these are addresses like A16, A15, and A14, but for a non-activation com-

mand with ACT_n HIGH, these are command pins for READ, WRITE, and other commands de-

fined in Command Truth Table.

RESET_n CMOS Input Active LOW asynchronous reset: Reset is active when RESET_n is LOW and inactive when RE-

SET_n is HIGH. RESET_n must be HIGH during normal operation.

SAx Input

Serial address inputs: Used to configure the temperature sensor/SPD EEPROM address range

on the I

C bus.

SCL Input

Serial clock for temperature sensor/SPD EEPROM: Used to synchronize communication to

and from the temperature sensor/SPD EEPROM on the I

C bus.

DQx, CBx I/O Data input/output and check bit input/output: Bidirectional data bus. DQ represents

DQ[3:0], DQ[7:0], and DQ[15:0] for the x4, x8, and x16 configurations, respectively. If cyclic re-

dundancy checksum (CRC) is enabled via the mode register, the CRC code is added at the end of

the data burst. Any one or all of DQ0, DQ1, DQ2, or DQ3 may be used for monitoring of inter-

nal V

REF

level during test via mode register setting MR[4] A[4] = HIGH; training times change

when enabled.

DM_n/DBI_n/

TDQS_t (DMU_n,

DBIU_n), (DML_n/

DBIl_n)

I/O Input data mask and data bus inversion: DM_n is an input mask signal for write data. Input

data is masked when DM_n is sampled LOW coincident with that input data during a write ac-

cess. DM_n is sampled on both edges of DQS. DM is multiplexed with the DBI function by the

mode register A10, A11, and A12 settings in MR5. For a x8 device, the function of DM or TDQS

is enabled by the mode register A11 setting in MR1. DBI_n is an input/output identifying

whether to store/output the true or inverted data. If DBI_n is LOW, the data will be stored/

output after inversion inside the DDR4 device and not inverted if DBI_n is HIGH. TDQS is only

supported in x8 SDRAM configurations (TDQS is not valid for UDIMMs).

SDA I/O Serial Data: Bidirectional signal used to transfer data in or out of the EEPROM or EEPROM/TS

combo device.

DQS_t

DQS_c

DQSU_t

DQSU_c

DQSL_t

DQSL_c

I/O Data strobe: Output with read data, input with write data. Edge-aligned with read data, cen-

tered-aligned with write data. For x16 configurations, DQSL corresponds to the data on

DQ[7:0], and DQSU corresponds to the data on DQ[15:8]. For the x4 and x8 configurations, DQS

corresponds to the data on DQ[3:0] and DQ[7:0], respectively. DDR4 SDRAM supports a differen-

tial data strobe only and does not support a single-ended data strobe.

ALERT_n Output Alert output: Possesses functions such as CRC error flag and command and address parity error

flag as output signal. If a CRC error occurs, ALERT_n goes LOW for the period time interval and

returns HIGH. If an error occurs during a command address parity check, ALERT_n goes LOW un-

til the on-going DRAM internal recovery transaction is complete. During connectivity test mode,

this pin functions as an input. Use of this signal is system-dependent. If not connected as signal,

ALERT_n pin must be connected to V

on DIMMs.

EVENT_n Output Temperature event: The EVENT_n pin is asserted by the temperature sensor when critical tem-

perature thresholds have been exceeded. This pin has no function (NF) on modules without

temperature sensors.

8GB (x64, SR) 288-Pin DDR4 UDIMM

Pin Descriptions

PDF: 09005aef86418d84

atf8c1gx64az.pdf – Rev. C 1/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

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MTA8ATF1G64AZ-2G3A1

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