FXO-LC53 Series
Page 5 of 15
© 2008 FOX ELECTRONICS | ISO9001:2000 Certified
Jitter is frequency dependent. Below are typical values at select frequencies.
Phase Jitter is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; V
DD
= 3.3V.
TIE
was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V
DD
= 3.3V.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
LVDS Phase Jitter & Time Interval Error (TIE)
Frequency
Phase Jitter
(12kHz to 20MHz)
T I E
(Sigma of Jitter Distribution)
Units
62.5 MHz 0.77 3.0 pS RMS
156.25 MHz 1.19 3.6 pS RMS
212.5 MHz 0.89 3.9 pS RMS
622.08MHz
0.99
3.2
pS RMS
LVDS Random & Deterministic Jitter Composition
Frequency
Random (Rj)
(pS RMS)
Deterministic (Dj)
(pS P-P)
Total Jitter (Tj)
(14 x Rj) + Dj
62.5 MHz 1.3 7.0 24.9 pS
156.25 MHz 1.3 5.8 23.6 pS
212.5 MHz 0.9 6.7 18.7 pS
622.08 MHz
1.1
5.3
20.7 pS
Phase Noise
Offset Frequenc
10Hz to 40MHz
(dBc / Hz) vs. offset frequency
Phase Noise Graph
1k
-110dBc
-120dBc
-130dBc
-150dBc
-140dBc
-160dBc
10 100
-100dBc
-60dBc
-80dBc
-90dBc
-70dBc
-40dBc
-50dBc
-30dBc
-20dBc
-10dBc
0 dBc
1M10k 100k
FOUR frequencies matching
10M 40M
62.5 MHz
212.5 MHz
622.08 MHz
62.5 MHz
622.08 MHz
212.5 MHz
156.25MHz
156.25MHz
Data Collected using HP 3048A
the below jitter measurements