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ADG706BRUZ

P1-P3P4-P6P7-P9P10-P12
–4–
REV. B
ADG706/ADG707
(V
DD
= +2.5 V ⴞ10%, V
SS
= –2.5 V ⴞ10%, GND = 0 V, unless otherwise noted.)
DUAL SUPPLY
1
–40ⴗC
Parameter 25ⴗC to +85ⴗC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V
SS
to V
DD
V
ON Resistance (R
ON
) 2.5 Ω typ V
S
= V
SS
to V
DD
, I
DS
= 10 mA;
4.5 5 Ω max Test Circuit 1
ON Resistance Match Between 0.3 Ω typ V
S
= V
SS
to V
DD
, I
DS
= 10 mA
Channels (∆R
ON
) 0.8 Ω max
ON Resistance Flatness (R
FLAT(ON)
) 0.5 Ω typ V
S
= V
SS
to V
DD
, I
DS
= 10 mA
1.2 Ω max
LEAKAGE CURRENTS V
DD
= +2.75 V, V
SS
= –2.75 V
Source OFF Leakage I
S
(OFF) ± 0.01 nA typ
V
S
= +2.25 V/–1.25 V, V
D
= –1.25 V/+2.25 V;
± 0.1 ± 0.3 nA max Test Circuit 2
Drain OFF Leakage I
D
(OFF) ± 0.01 nA typ
V
S
= +2.25 V/–1.25 V, V
D
= –1.25 V/+2.25 V;
ADG706 ± 0.4 ± 1.5 nA max Test Circuit 3
ADG707 ± 0.2 ± 1nA max
Channel ON Leakage I
D
, I
S
(ON) ±0.01 nA typ
V
S
= V
D
= +2.25 V/–1.25 V, Test Circuit 4
ADG706 ± 0.4 ± 1.5 nA max
ADG707 ± 0.2 ± 1nA max
DIGITAL INPUTS
Input High Voltage, V
INH
1.7 V min
Input Low Voltage, V
INL
0.7 V max
Input Current
I
INL
or I
INH
0.005 µA typ V
IN
= V
INL
or V
INH
± 0.1 µA max
C
IN
, Digital Input Capacitance 5 pF typ
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
40 ns typ R
L
= 300 Ω, C
L
= 35 pF, Test Circuit 5
60 ns max V
S1
= 1.5 V/0 V, V
S16
= 0 V/1.5 V
Break-Before-Make Time Delay, t
D
15 ns typ R
L
= 300 Ω, C
L
= 35 pF;
1 ns min V
S
= 1.5 V, Test Circuit 6
t
ON
(EN) 32 ns typ R
L
= 300 Ω, C
L
= 35 pF;
50 ns max V
S
= 1.5 V, Test Circuit 7
t
OFF
(EN) 16 ns typ R
L
= 300 Ω, C
L
= 35 pF;
26 ns max V
S
= 1.5 V, Test Circuit 7
Charge Injection ± 8pC typ V
S
= 0 V, R
S
= 0 Ω, C
L
= 1 nF;
Test Circuit 8
OFF Isolation –60 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 10 MHz;
–80 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
Test Circuit 9
Channel-to-Channel Crosstalk –60 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 10 MHz;
–80 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
Test Circuit 10
–3 dB Bandwidth
ADG706 25 MHz typ R
L
= 50 Ω, C
L
= 5 pF, Test Circuit 9
ADG707 36 MHz typ R
L
= 50 Ω, C
L
= 5 pF, Test Circuit 9
C
S
(OFF) 13 pF typ f = 1 MHz
C
D
(OFF)
ADG706 180 pF typ f = 1 MHz
ADG707 90 pF typ f = 1 MHz
C
D
, C
S
(ON)
ADG706 200 pF typ f = 1 MHz
ADG707 100 pF typ f = 1 MHz
POWER REQUIREMENTS
I
DD
0.001 µA typ V
DD
= +2.75 V
1.0 µA max Digital Inputs = 0 V or 2.75 V
I
SS
0.001 µA typ V
SS
= –2.75 V
1.0 µA max Digital Inputs = 0 V or 2.75 V
NOTES
1
Temperature range is –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–5–
REV. B
ADG706/ADG707
ABSOLUTE MAXIMUM RATINGS
1
(T
A
= 25°C unless otherwise noted.)
V
DD
to V
SS
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
SS
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –3.5 V
Analog Inputs
2
. . . . . . . . . . . . . . V
SS
– 0.3 V to V
DD
+ 0.3 V or
30 mA, Whichever Occurs First
Digital Inputs
2
. . . . . . . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V or
30 mA, Whichever Occurs First
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
(Pulsed at 1 ms, 10% Duty Cycle max)
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 30 mA
Operating Temperature Range
Industrial . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
PIN CONFIGURATIONS
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
TSSOP Package
θ
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . 97.9°C/W
θ
JC
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 14°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . . 300°C
IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . . . . 220°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating condi-
tions for extended periods may affect device reliability. Only one absolute maximum
rating may be applied at any one time.
2
Overvoltages at A, EN, S, or D will be clamped by internal diodes. Current should
be limited to the maximum ratings given.
TOP VIEW
(Not to Scale)
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
ADG706
NC = NO CONNECT
A3
NC
GND
S9
S10
S11
S12
V
DD
NC
NC
S16
S13
S14
S15
A2
A1
A0
EN
S1
S2
S3
D
V
SS
S8
S7
S4
S5
S6
TOP VIEW
(Not to Scale)
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
ADG707
NC = NO CONNECT
NC
NC
GND
S1B
S2B
S3B
S4B
V
DD
DB
NC
S8B
S5B
S6B
S7B
A2
A1
A0
EN
S1A
S2A
S3A
DA
V
SS
S8A
S7A
S4A
S5A
S6A
ORDERING GUIDE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the ADG706/ADG707 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
1
Z = RoHS Compliant Part.
–6–
REV. B
ADG706/ADG707
TERMINOLOGY
C
D
(OFF) “OFF” Switch drain capacitance. Measured
with reference to ground.
C
D
, C
S
(ON) “ON” Switch capacitance. Measured with
reference to ground.
C
IN
Digital input capacitance
t
TRANSITION
Delay time measured between the 50% and
90% points of the digital inputs and the switch
“ON” condition when switching from one
address state to another
t
ON
(EN) Delay time between the 50% and 90% points
of the EN digital input and the Switch “ON”
condition
t
OFF
(EN) Delay time between the 50% and 90% points
of the EN digital input and the Switch “OFF”
condition
t
OPEN
“OFF” Time measured between the 80% points
of both switches when switching from one
address state to another
Charge Measure of the glitch impulse transferred from
Injection the digital input to the analog output during
switching
OFF Isolation Measure of unwanted signal coupling through
an “OFF” switch
Crosstalk Measure of unwanted signal that is coupled
through from one channel to another as a result
of parasitic capacitance
Bandwidth Frequency at which the output is attenuated
by 3 dB
ON Response Frequency response of the “ON” Switch
Insertion Loss due to the ON Resistance of
Loss the switch
V
DD
Most positive power supply potential
V
SS
Most negative power supply in a dual-supply
application. In single-supply applications, this
should be tied to ground at the device.
I
DD
Positive supply current
I
SS
Negative supply current
GND Ground (0 V) reference
S Source terminal. May be an input or output.
DDrain terminal. May be an input or output.
AX Logic control input
EN Active high device enable
V
D
(V
S
)Analog voltage on terminals D, S
R
ON
Ohmic resistance between D and S
∆R
ON
ON Resistance match between any two channels,
i.e., R
ON
max – R
ON
min
R
FLAT(ON)
Flatness is defined as the difference between the
maximum and minimum value of ON resistance
as measured over the specified analog signal
range.
I
S
(OFF) Source leakage current with the Switch “OFF”
I
D
(OFF) Drain leakage current with the Switch “OFF”
I
D
, I
S
(ON) Channel leakage current with the Switch “ON”
V
INL
Maximum input voltage for Logic “0”
V
INH
Minimum input voltage for Logic “1”
I
INL
(I
INH
) Input current of the digital input
C
S
(OFF) “OFF” Switch Source Capacitance. Measured
with reference to ground.
Table I. ADG706 Truth Table
A3 A2 A1 A0 EN ON Switch
XXXX0NONE
000011
000112
001013
001114
010015
010116
011017
011118
100019
1001110
1010111
1011112
1100113
1101114
1110115
1111116
X = Don’t Care
Table II. ADG707 Truth Table
A2 A1 A0 EN ON Switch Pair
XXX 0 NONE
000 1 1
001 1 2
010 1 3
011 1 4
100 1 5
101 1 6
110 1 7
111 1 8
X = Don’t Care
P1-P3P4-P6P7-P9P10-P12

ADG706BRUZ

Mfr. #:
Buy ADG706BRUZ
Manufacturer:
Analog Devices Inc.
Description:
Multiplexer Switch ICs 16:1 25MHz 2.5 Ohm CMOS
Lifecycle:
New from this manufacturer.
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