26 Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. E
10/25/2013
IS61NLF25672/IS61NVF25672
IS61NLF51236/IS61NVF51236
IS61NLF102418/IS61NVF102418
TAP Electrical Characteristics OvertheOperatingRange
(1,2)
Symbol Parameter Test Conditions Min. Max. Units
Voh1 OutputHIGHVoltage Ioh=–2.0mA 1.7 — V
Voh2 OutputHIGHVoltage Ioh=–100µA 2.1 — V
Vol1 OutputLOWVoltage Iol = 2.0 mA — 0.7V
Vol2 OutputLOWVoltage Iol = 100 µA — 0.2V
VIh InputHIGHVoltage 1.7 Vdd +0.3V
VIl InputLOWVoltage –0.3 0.7V
Ix InputLeakageCurrent VSS ≤VI≤Vddq –10 10 µA
Notes:
1. AllVoltagereferencedtoGround.
2. Overshoot:V
Ih (AC) ≤Vdd+1.5Vfort≤ tTcyc/2,
Undershoot:V
Il (AC) ≤ 0.5Vfort≤ tTcyc/2,
Power-up:V
Ih<2.6VandVdd<2.4VandVddq<1.4Vfort<200ms.
TAP AC ELECTRICAL CHARACTERISTICS
(1,2)
(OVER OPERATING RANGE)
Symbol Parameter Min. Max. Unit
tTcyc TCKClockcycletime 100 — ns
fTf TCKClockfrequency — 10 MHz
tTh TCKClockHIGH 40— ns
tTl TCKClockLOW 40 — ns
tTmSS TMSsetuptoTCKClockRise 10 — ns
tTdIS TDIsetuptoTCKClockRise 10 — ns
tcS CapturesetuptoTCKRise 10 — ns
tTmSh
TMSholdafterTCKClockRise
10 — ns
tTdIh TDIHoldafterClockRise 10 — ns
tch CaptureholdafterClockRise 10 — ns
tTdoV TCKLOWtoTDOvalid — 20 ns
tTdox TCKLOWtoTDOinvalid 0 — ns
Notes:
1. tcS and tch refer to the set-up and hold time requirements of latching data from the boundary scan register.
2.TestconditionsarespeciedusingtheloadinTAPACtestconditions.t
r/tf = 1 ns.