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SCAN182373A
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit of current limit is sufficient to protect inputs.
DC Electrical Characteristics
Note 3: Guaranteed not tested.
Storage Temperature −65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150°C
V
CC
Pin Potential to Ground Pin −0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Any Output
in Disabled or Power-Off State
−0.5V to +5.5V
in the HIGH State
−0.5V to V
CC
Current Applied to Output
in LOW State (Max) Twice the Rated I
OL
(mA)
DC Latchup Source Current
−500 mA
Over Voltage Latchup (I/O) 10V
ESD (HBM) Min 2000V
Free Air Ambient Temperature
−40°C to +85°C
Supply Voltage
+4.5V to +5.5V
Minimum Input Edge Rate (
∆V/∆t)
Data Input 50 mV/ns
Enable Input 20 mV/ns
Symbol Parameter
V
CC
Min Typ Max Units Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized LOW Signal
V
CD
Input Clamp Diode Voltage Output Min −1.2 V I
IN
= −18 mA
V
OH
HIGH Voltage Min 2.5 V I
OH
= −3 mA
Min 2.0 V I
OH
= −32 mA
V
OL
Output LOW Voltage Min 0.8 V I
OL
= 15 mA
I
IH
Input HIGH Current All Others Max 5 µAV
IN
= 2.7V (Note 3)
Max 5 µAV
IN
= V
CC
TMS, TDI Max 5 µAV
IN
= V
CC
I
BVI
Input HIGH Current Breakdown Test Max 7 µAV
IN
= 7.0V
I
BVIT
Input HIGH Current Breakdown Test (I/O) Max 100 µAV
IN
= 5.5V
I
IL
Input LOW Current All Others Max −5 µAV
IN
= 0.5V (Note 3)
Max −5 µAV
IN
= 0.0V
TMS, TDI Max −385 µAV
IN
= 0.0V
V
ID
Input Leakage Test 0.0 4.75 V I
ID
= 1.9 µA
All Other Pins Grounded
I
IH
+ I
OZH
Output Leakage Current Max 50 µAV
OUT
= 2.7V
I
IL
+ L
OZL
Output Leakage Current Max −50 V
OUT
= 0.5V
I
OZH
Output Leakage Current Max 50 µAV
OUT
= 2.7V
I
OZL
Output Leakage Current Max −50 µAV
OUT
= 0.5V
I
OS
Output Short-Circuit Current Max −100 −275 mA V
OUT
= 0.0V
I
CEX
Output HIGH Leakage Current Max 50 µAV
OUT
= V
CC
I
ZZ
Bus Drainage Test 0.0 100 µAV
OUT
= 5.5V
All Others Grounded
I
CCH
Power Supply Current Max 250 µAV
OUT
= V
CC
; TDI, TMS = V
CC
Max 1.0 mA V
OUT
= V
CC
; TDI, TMS = GND
I
CCL
Power Supply Current Max 65 mA V
OUT
= LOW; TDI, TMS = V
CC
Max 65.8 mA V
OUT
= LOW; TDI, TMS = GND
I
CCZ
Power Supply Current Max 250 µA TDI, TMS = V
CC
Max 1.0 mA TDI, TMS = GND
I
CCT
Additional I
CC
/Input All Other Inputs Max 2.9 mA V
IN
= V
CC
−2.1V
TDI, TMS Inputs Max 3 mA V
IN
= V
CC
−2.1V
I
CCD
Dynamic I
CC
No Load Max 0.2 mA/ Outputs Open
MHz One Bit Toggling, 50% Duty Cycle
