74ALVC573_3 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 03 — 26 October 2007 11 of 17
NXP Semiconductors
74ALVC573
Octal D-type transparent latch; 3-state
Test data is given in Table 9.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 12. Test circuitry for switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aae331
V
EXT
V
CC
V
I
V
O
DUT
C
L
R
T
R
L
R
L
G
Table 9. Test data
Supply voltage Input Load V
EXT
V
I
t
r
, t
f
C
L
R
L
t
PLH
, t
PHL
t
PLZ
, t
PZL
t
PHZ
, t
PZH
1.65 V to 1.95 V V
CC
≤ 2.0 ns 30 pF 1 kΩ open 2V
CC
GND
2.3 V to 2.7 V V
CC
≤ 2.0 ns 30 pF 500 Ω open 2V
CC
GND
2.7 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 6 V GND
3.0 V to 3.6 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 6 V GND
