1998-2012 Microchip Technology Inc. DS20067K-page 3
93AA46/56/66
TABLE 1-1: DC AND AC ELECTRICAL CHARACTERISTICS
VCC = +1.8V to +5.5V Commercial (C): TA = 0°C to +70°C
Industrial (I): T
A = -40°C to +85°C
Parameter Symbol Min Typ Max Units Conditions
High-level input voltage V
IH12.0 —VCC+1 V VCC 2.7V
V
IH20.7 VCC —VCC+1 V VCC < 2.7V
Low-level input voltage VIL1 -0.3 — 0.8 V VCC 2.7V
VIL2 -0.3 — 0.2 VCC VVCC < 2.7V
Low-level output voltage V
OL1— — 0.4 VIOL = 2.1 mA; VCC = 4.5V
VOL2— — 0.2 VIOL = 100A; VCC = 1.8V
High-level output voltage VOH12.4 — — VIOH = -400 A; VCC = 4.5V
V
OH2VCC-0.2 — — V IOH = -100 A; VCC = 1.8V
Input leakage current ILI -10 — 10 AVIN = 0.1V to VCC
Output leakage current ILO -10 — 10 AVOUT = 0.1V to VCC
Pin capacitance
(all inputs/outputs)
CIN, COUT —— 7 pFVIN/VOUT = 0V (Note 1 & 2)
T
A = +25°C, FCLK = 1 MHz
Operating current ICC write — — 3 mA FCLK = 2 MHz; VCC=5.5V
(Note 2)
I
CC read — —
70
1
500
mA
A
A
FCLK = 2 MHz; VCC = 5.5V
F
CLK = 1 MHz; VCC = 3.0V
F
CLK = 1 MHz; VCC = 1.8V
Standby current ICCS
2
100
30
A
A
A
CLK = CS = 0V; VCC = 5.5V
CLK = CS = 0V; V
CC = 3.0V
CLK = CS = 0V; V
CC = 1.8V
ORG, DI = V
SS or VCC
Clock frequency FCLK 2
1
MHz
MHz
VCC 4.5V
V
CC < 4.5V
Clock high time TCKH 250 ns
Clock low time TCKL 250 ns
Chip select setup time T
CSS 50 ns Relative to CLK
Chip select hold time TCSH 0 ns Relative to CLK
Chip select low time TCSL 250 ns
Data input setup time T
DIS 100 ns Relative to CLK
Data input hold time TDIH 100 ns Relative to CLK
Data output delay time T
PD
400 ns
CL = 100 pF
Data output disable time TCZ 100 ns
CL = 100 pF (Note 2)
Status valid time TSV 500 ns
CL = 100 pF
Program cycle time TWC 410ms
Erase/Write mode
TEC 815ms
ERAL mode (Vcc = 5V 10%)
TWL 16 30 ms
WRAL mode (Vcc = 5V 10%)
Endurance — 1M — 1M — 25°C, Vcc = 5.0V, Block mode
(Note 3)
Note 1: This parameter is tested at T
A = 25C and FCLK = 1 MHz.
2: This parameter is periodically sampled and not 100% tested.
3: This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from Microchip’s web site.