10
Electrical Specifications
Over recommended operating range (3.0V V
DD1
3.6V, 3.0V V
DD2
3.6V, T
A
= -40°C to +100° C)
unless otherwise specified.
All typical specifications are at T
A
= +25°C , V
DD1
= V
DD2
= +3.3V.
Parameter Symbol Min. Typ. Max. Units Test Conditions
Input Threshold Current I
TH
2.7 7.0 mA I
OL(Sinking)
=13 mA, V
O
= 0.6V
High Level Output Current I
OH
4.7 100.0 µAI
F
= 250 µA, V
O
= 3.3V
Low Level Output Voltage V
OL
0.36 0.68 V I
OL(Sinking)
= 13 mA, I
F
= 7mA
High Level Supply Current (per channel) I
DDH
3.2 5.0 mA I
F
=0 mA
Low Level Supply Current (per channel) I
DDL
4.6 7.5 mA I
F
= 10 mA
Input Forward Voltage V
F
1.25 1.52 1.80 V I
F
= 10 mA, T
A
=25°C
Input Reverse Breakdown Voltage BV
R
5.0 V I
R
=10 µA
Input Diode Temperature Coefficient V
F
/ T
A
-1.8 mV/°CI
F
=10 mA
Input Capacitance C
IN
80 pF f = 1 MHz, V
F
= 0V
Switching Specifications
Over recommended operating range (3.0V V
DD1
3.6V, 3.0V V
DD2
3.6V, I
F
= 8.0 mA, T
A
= -40°C to +100°C)
unless otherwise specified.
All typical specifications are at T
A
= +25°C , V
DD1
= V
DD2
= +3.3V.
Parameter Symbol Min. Typ. Max. Units Test Conditions
Maximum Data Rate 10 15 MBd R
L
= 350, C
L
= 15 pF
Pulse Width t
PW
100 ns R
L
= 350, C
L
= 15 pF
Propagation Delay Time to Logic High Output Level
[5]
t
PLH
52 100 ns R
L
= 350, C
L
= 15 pF
Propagation Delay Time to Logic Low Output Level
[6]
t
PHL
44 100 ns R
L
= 350, C
L
= 15 pF
Pulse Width Distortion |t
PHL
t
PLH
| |PWD| 8 35 ns R
L
= 350, C
L
= 15 pF
Propagation Delay Skew
[7]
t
PSK
40 ns R
L
= 350, C
L
= 15 pF
Output Rise Time (10 90%) t
R
35 ns R
L
= 350, C
L
= 15 pF
Output Fall Time (10 90%) t
F
12 ns R
L
= 350, C
L
= 15 pF
Logic High Common Mode Transient Immunity
[8]
|CM
H
| 10 kV/µsV
cm
= 1000V, I
F
= 0 mA,
V
O
= 2.0V, R
L
= 350,
T
A
= 25°C
Logic Low Common Mode Transient Immunity
[8]
|CM
L
| 10 kV/µsV
cm
= 1000V, I
F
= 8 mA,
V
O
= 0.8V, R
L
= 350,
T
A
= 25°C
Notes:
5. t
PLH
is measured from the 4.0 mA level on the
falling edge of the input pulse to the 1.5V
level on the rising edge of the output pulse.
6. t
PHL
is measured from the 4.0 mA level on the
rising edge of the input pulse to the 1.5V level
on the falling edge of the output pulse.
7. t
PSK
is equal to the worst case difference in
t
PHL
and/or t
PLH
that will be seen between
units at any given temperature and specified
test conditions.
8. CM
H
is the maximum common mode voltage
slew rate that can be sustained while
maintaining V
O
> 2.0V. CM
L
is the maximum
common mode voltage slew rate that can be
sustained while maintaining V
O
< 0.8V. The
common mode voltage slew rates apply to
both rising and falling common mode voltage
edges.
11
Electrical Specifications
Over recommended operating range (4.5V V
DD1
5.5V, 4.5V V
DD2
5.5V, T
A
= -40°C to +100° C)
unless otherwise specified.
All typical specifications are at T
A
= +25°C, V
DD1
= V
DD2
= +5.0V.
Parameter Symbol Min. Typ. Max. Units Test Conditions
Input Threshold Current I
TH
2.7 7.0 mA I
OL(Sinking)
=13 mA, V
O
= 0.6V
High Level Output Current I
OH
3.8 100.0 µAI
F
= 250 µA, V
O
= 5.5V
Low Level Output Voltage V
OL
0.36 0.6 V I
OL(Sinking)
=13 mA, I
F
=7 mA
High Level Supply Current (per channel) I
DDH
4.3 7.5 mA I
F
= 0 mA
Low Level Supply Current (per channel) I
DDL
5.8 10.5 mA I
F
= 10 mA
Input Forward Voltage V
F
1.25 1.52 1.8 V I
F
= 10 mA, T
A
= 25°C
Input Reverse Breakdown Voltage BV
R
5.0 V I
R
= 10 µA
Input Diode Temperature Coefficient V
F
/ T
A
-1.8 mV/°CI
F
= 10 mA
Input Capacitance C
IN
80 pF f = 1 MHz, V
F
= 0V
Switching Specifications
Over recommended operating range (4.5V V
DD1
5.5V, 4.5V V
DD2
5.5V, I
F
= 8.0 mA, T
A
= -40°C to +100°C)
unless otherwise specified.
All typical specifications are at T
A
=+25° C, V
DD1
= V
DD2
= +5.0V.
Parameter Symbol Min. Typ. Max. Units Test Conditions
Maximum Data Rate 10 15 MBd R
L
= 350, C
L
=15 pF
Pulse Width t
PW
100 ns R
L
= 350, C
L
=15 pF
Propagation Delay Time to Logic High Output Level
[5]
t
PLH
46 100 ns R
L
= 350, C
L
=15 pF
Propagation Delay Time to Logic Low Output Level
[6]
t
PHL
43 100 ns R
L
= 350, C
L
=15 pF
Pulse Width Distortion |t
PHL
t
PLH
| |PWD| 5 35 ns R
L
= 350, C
L
=15 pF
Propagation Delay Skew
[7]
t
PSK
40 ns R
L
= 350, C
L
=15 pF
Output Rise Time (10 90%) t
R
30 ns R
L
= 350, C
L
=15 pF
Output Fall Time (10 90%) t
F
12 ns R
L
= 350, C
L
=15 pF
Logic High Common Mode Transient Immunity
[8]
|CM
H
| 10 kV/µsV
cm
= 1000V, I
F
=0 mA,
V
O
= 2.0V, R
L
=350,
T
A
= 25°C
Logic Low Common Mode Transient Immunity
[8]
|CM
L
| 10 kV/µsV
cm
= 1000V, I
F
= 8 mA,
V
O
= 0.8V, R
L
= 350,
T
A
= 25°C
Notes:
5. t
PLH
is measured from the 4.0 mA level on the
falling edge of the input pulse to the 1.5V
level on the rising edge of the output pulse.
6. t
PHL
is measured from the 4.0 mA level on the
rising edge of the input pulse to the 1.5V level
on the falling edge of the output pulse.
7. t
PSK
is equal to the worst case difference in
t
PHL
and/or t
PLH
that will be seen between
units at any given temperature and specified
test conditions.
8. CM
H
is the maximum common mode voltage
slew rate that can be sustained while
maintaining V
O
> 2.0V. CM
L
is the maximum
common mode voltage slew rate that can be
sustained while maintaining V
O
< 0.8V. The
common mode voltage slew rates apply to
both rising and falling common mode voltage
edges.
12
Package Characteristics
All specifications are at T
A
=+25°C.
Parameter Symbol Min. Typ. Max. Units Test Conditions
Input-Output Momentary SO8 V
ISO
2500 V
RMS
RH 50%, t = 1 min
Withstand Voltage
[9]
SO16 V
ISO
2500 RH 50%, t = 1 min
Input-Output Insulation
[10] [11]
SO8 I
I-O
5 µA 45% RH, t=5 sec, V
I-O
= 3kV DC
SO16 I
I-O
5 45% RH, t=5 sec, V
I-O
=3kV DC
Input-Output Resistance
[10]
SO8 R
I-O
10
9
10
11
V
I-O
= 500V DC
SO16 R
I-O
10
9
10
11
V
I-O
= 500V DC
Input-Output Capacitance
[10]
SO8 C
I-O
0.7 pF f = 1 MHz
SO16 C
I-O
0.7 f = 1 MHz
Input-Input Insulation SO8 I
I-I
0.005 µARH45%, t= 5 sec, V
I-I
= 500V
Leakage Current
[12]
SO16 I
I-I
0.005 RH 45%, t = 5 sec, V
I-I
= 500V
Input-Input Resistance
[12]
SO8 R
I-I
10
11
RH 45%, t= 5 sec, V
I-I
= 500V
SO16 R
I-I
10
11
RH 45%, t =5 sec, V
I-I
=500V
Input-Input Capacitance
[12]
SO8 C
I-I
0.1 pF f = 1 MHz
SO16 C
I-I
0.12 f = 1 MHz
Electrostatic Discharge Sensitivity
This product has been tested for
electrostatic sensitivity to the
limits stated in the specifications.
However, Avago recommends that
all integrated circuits be handled
with appropriate care to avoid
damage. Damage caused by
inappropriate handling or storage
could range from performance
degradation to complete failure.
Notes:
9. V
ISO
is a dielectric voltage rating that should
not be interpreted as an input-output
continuous voltage rating. For continuous
voltage rating, refer to the IEC/EN/DIN EN
60747-5-2 Insulation Characteristics Table (if
applicable), the equipment level safety
specification or Avago Application Note 1074
entitled Optocoupler Input-Output
Endurance Voltage.
10. Measured between each input pair shorted
together and all output connections for that
channel shorted together.
11. In accordance to UL1577, each optocoupler
is proof tested by applying an insulation test
voltage 3000 Vrms for 1 sec (leakage
detection current limit, I
I-O
5 µA). This test
is performed before the 100% production test
for partial discharge (Method b) shown in the
IEC/EN/DIN EN 60747-5-2 Insulation
Characteristics Table, if applicable.
12. Measured between inputs with the LED
anode and cathode shorted together.

ACSL-6210-56R

Mfr. #:
Manufacturer:
Broadcom / Avago
Description:
High Speed Optocouplers 3.0V - 5.5V 15MBd
Lifecycle:
New from this manufacturer.
Delivery:
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Payment:
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