MC74HC245A
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2
FUNCTION TABLE
Control Inputs
Operation
Output
Enable
Direction
L L Data Transmitted from Bus B to Bus A
L H Data Transmitted from Bus A to Bus B
H X Buses Isolated (High−Impedance State)
X = don’t care
MAXIMUM RATINGS (Note 1)
Symbol
Parameter Value Unit
V
CC
DC Supply Voltage −0.5 to +7.0 V
V
IN
DC Input Voltage −0.5 to V
CC
+ 0.5 V
V
OUT
DC Output Voltage (Note 2) −0.5 to V
CC
+ 0.5 V
I
IK
DC Input Diode Current ±20 mA
I
OK
DC Output Diode Current ±35 mA
I
OUT
DC Output Sink Current ±35 mA
I
CC
DC Supply Current per Supply Pin ±75 mA
I
GND
DC Ground Current per Ground Pin ±75 mA
T
STG
Storage Temperature Range −65 to +150
_C
T
L
Lead Temperature, 1 mm from Case for 10 Seconds 260
_C
T
J
Junction Temperature Under Bias +150
_C
q
JA
Thermal Resistance SOIC
TSSOP
96
128
_C/W
P
D
Power Dissipation in Still Air at 85_C SOIC
TSSOP
500
450
mW
MSL Moisture Sensitivity Level 1
F
R
Flammability Rating Oxygen Index: 30% to 35% UL 94 V−0 @ 0.125 in
V
ESD
ESD Withstand Voltage Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
u2000
u200
u1000
V
I
LATCHUP
Latchup Performance Above V
CC
and Below GND at 85_C (Note 6)
±300 mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 20 ounce copper trace with no air flow.
2. I
O
absolute maximum rating must observed.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Min Max Unit
V
CC
DC Supply Voltage (Referenced to GND) 2.0 6.0 V
V
in
, V
out
DC Input Voltage, Output Voltage (Referenced to GND) 0 V
CC
V
T
A
Operating Temperature, All Package Types –55 +125
_C
t
r
, t
f
Input Rise and Fall Time V
CC
= 2.0 V
(Figure 1) V
CC
= 4.5 V
V
CC
= 6.0 V
0
0
0
1000
500
400
ns
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.