LT1122
7
1122fb
For more information www.linear.com/LT1122
TYPICAL PERFORMANCE CHARACTERISTICS
Warm-Up Drift Noise Spectrum 0.1Hz to 10Hz Noise
Total Harmonic Distortion + Noise
vs Frequency Inverting Gain
Total Harmonic Distortion + Noise
vs Frequency Noninverting Gain
Intermodulation Distortion
(CCIF Method) vs Frequency
LT1122 and LF156*
Distribution of Input Offset
Voltage
Input Bias and Offset Currents
Over Temperature
Bias and Offset Currents Over the
Common-Mode Range
INPUT OFFSET VOLTAGE (µV)
–900
0
NUMBER OF UNITS
200
400
600
800
–500 –100
100
500
V = ±15V
T = 25°C
(NOT WARMED UP)
S
A
3370 UNITS TESTED
IN ALL PACKAGES
1122 TPC05
900
CHIP TEMPERATURE (°C)
0
1
INPUT BIAS AND OFFSET CURRENTS (pA)
300
1k
3k
10k
25 50 75 100
125
100
30
10
3
BIAS
CURRENT
OFFSET
CURRENT
V = ±15V
V = 0V
S
CM
1122 TPC06
30k
100k
COMMON-MODE INPUT VOLTAGE (V)
15
0
INPUT BIAS AND OFFSET CURRENT (pA)
20
40
60
80
100
120
10 5 5 15
V = ±15V
T = 25°C
S
A
0
10
(NOT-WARMED UP)
BIAS
CURRENT
OFFSET
CURRENT
1122 TPC07
TIME AFTER POWER ON (MINUTES)
0
1
CHANGE IN OFFSET VOLTAGE (µV)
50
100
150
200
250
1 2 3
V = ±15V
T = 25°C
S
A
J PACKAGE
N PACKAGE
SO PACKAGE
IN STILL AIR (SO PACKAGE
SOLDERED ONTO BOARD)
1122 TPC08
FREQUENCY (Hz)
1
10
VOLTAGE NOISE DENSITY (nV/√Hz)
100
1000
3 10 10k
30 100 300 1k
3k
V = ±15V
T = 25°C
S
A
1122 TPC09
TIME (SECONDS)
0
NOISE VOLTAGE (1µV/DIV)
2 4 8 106
1122 TPC10
FREQUENCY (Hz)
20
0.0001
TOTAL HARMONIC DISTORTION + NOISE (%)
0.001
0.01
0.1
100 1k 20k
A
V
= –50
A
V
= –10
A
V
= –1
10k
T = 25°C
V = ±15V
Z = 5k//15pF
V = 7V RMS
A
S
L
O
1122 TPC11
FREQUENCY (Hz)
20
0.0001
TOTAL HARMONIC DISTORTION + NOISE (%)
0.001
0.01
0.1
100 1k 20k
A
V
= 50
A
V
= 10
A
V
=1
10k
T = 25°C
V = ±15V
Z = 5k//15pF
V = 7V RMS
A
S
L
O
1122 TPC12
FREQUENCY (Hz)
3k
0.0001
INTERMODULATION DISTORTION (IMD) (%)
0.001
0.01
0.1
10k 20k
LT1122
LF156
V = ±15V
T = 25°C
A = –10
V = 7V RMS
Z = 5k//15pF
S
A
V
O
L
*SEE LT1115 DATA SHEET FOR DEFINITION
OF CCIF TESTING
1122 TPC13
LT1122
8
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For more information www.linear.com/LT1122
APPLICATIONS INFORMATION
Settling Time Measurements
Settling time test circuits shown on some competitive
devices’ data sheets require:
1. Aflat top” pulse generator. Unfortunately, flat top pulse
generators are not commercially available.
2. A variable feedback capacitor around the device under
test. This capacitor varies over a four-to-one range.
Presumably, as each op amp is measured for settling
time, the capacitor is fine tuned to optimize settling
time for that particular device.
3. A small inductor load to optimize settling.
The LT1122’s settling time is 100% tested in the test circuit
shown. Noflat top” pulse generator is required. The test
circuit can be readily constructed, using commercially
available ICs. Of course, standard high frequency board
construction techniques should be followed. All LT1122s
are measured with a constant feedback capacitor. No fine
tuning is required.
Speed Boost/Overcompensation Terminal
Pin 8 of the LT1122 can be used to change the input stage
operating current of the device. Shorting Pin 8 to the posi
-
tive supply (Pin 7) increases slew rate and bandwidth by
about 25%, but at the expense of a reduction in phase
margin by approximately 18 degrees. Unity-gain capacitive
load handling decreases from typically 500pF to 100pF.
Conversely, connecting a 15k
resistor from
Pin 8 to ground
pulls 1mA out of Pin 8 (with V
+
= 15V). This reduces slew
rate and bandwidth by 25%. Phase margin and capacitive
load handling improve; the latter typically increasing to
800pF.
High Speed Operation
As with most high speed amplifiers, care should be
taken with supply decoupling, lead dress and component
placement.
The power supply connections to the LT1122 must maintain
a low impedance to ground over a bandwidth of 20MHz.
This is especially important when driving a significant
resistive or capacitive load, since all current delivered to
the load comes from the power supplies. Multiple high
quality bypass capacitors are recommended for each power
supply line in any critical application. A 0.1µF ceramic and
aF electrolytic capacitor, as shown, placed as close as
possible to the amplifier (with short lead lengths to power
supply common) will assure adequate high frequency
bypassing, in most applications.
V
+
7
2
6
3
4
1µF
0.1µF
1µF
0.1µF
V
LT1122
1122 TA03
+
+
+
When the feedback around the op amp is resistive (R
F
),
a pole will be created with R
F
, the source resistance and
capacitance (R
S
, C
S
), and the amplifier input capacitance
(C
IN
≈ 4pF). In low closed-loop gain configurations and
with R
S
and R
F
in the kilohm range, this pole can create
excess phase shift and even oscillation. A small capaci-
tor (C
F
) in parallel with R
F
eliminates this problem. With
R
S
(C
S
+ C
IN
) = R
F
C
F
, the effect of the feedback pole is
completely removed.
R
S
C
S
C
IN
R
F
C
F
OUTPUT
+
1122 TA04
LT1122
9
1122fb
For more information www.linear.com/LT1122
TYPICAL APPLICATIONS
Quartz Stabilized Oscillator With 9ppm Distortion
W
DISTORTION
TRIM
50k
430pF
560k
47k
4kHz
J
CUT
LT1010LT1122
+
LT1122
–15V
15V
2k
1/4 LTC201
GROUND CRYSTAL CASE
= VACTEC VTL5C10 OR
CLAIREX CLM410
= 1N4148
15V
1M
560k
100k
Q1
2N3904
15V
1122 TA05
+
4.7k
4.7k 5k
OUTPUT
AMPLITUDE
TRIM
10µF
470
LT1006
LT1004
2.5V
4.7k
–15V
OUTPUT
+
MOUNT IN CLOSE
PROXIMITY
+

LT1122ACN8#PBF

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Operational Amplifiers - Op Amps Fast Settling, JFET In Op Amp
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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