AT27C4096-12JC

AT27C4096
4
Notes: 1. V
CC
must be applied simultaneously or before V
PP
, and removed simultaneously or after V
PP
.
2. V
PP
may be connected directly to V
CC
, except during programming. The supply current would then be the sum of I
CC
and I
PP
.
Note: 2, 3, 4, 5. See the AC Waveforms for Read Operation diagram.
DC and AC Operating Conditions for Read Operation
AT27C4096
-55 -70 -90 -12 -15
Operating
Temperature (Case)
Com. 0°C - 70°C0°C - 70°C0°C - 70°C0°C - 70°C0°C - 70°C
Ind. -40°C - 85°C-40°C - 85°C-40°C - 85°C-40°C - 85°C-40°C - 85°C
V
CC
Power Supply 5V ± 10% 5V ± 10% 5V ± 10% 5V ± 10% 5V ± 10%
DC and Operating Characteristics for Read Operation
Symbol Parameter Condition Min Max Units
I
LI
Input Load Current V
IN
= 0V to V
CC
± 1 µA
I
LO
Output Leakage Current V
OUT
= 0V to V
CC
± 5 µA
I
PP1
(2)
V
PP
(1)
Read/Standby Current V
PP
= V
CC
10 µA
I
SB
V
CC
(1)
Standby Current
I
SB1
(CMOS)
CE = V
CC
± 0.3V
100 µA
I
SB2
(TTL)
CE = 2.0 to V
CC
+ 0.5V
1mA
I
CC
V
CC
Active Current f = 5 MHz, I
OUT
= 0 mA, CE = V
IL
40 mA
V
IL
Input Low Voltage -0.6 0.8 V
V
IH
Input High Voltage 2.0 V
CC
+ 0.5 V
V
OL
Output Low Voltage I
OL
= 2.1 mA 0.4 V
V
OH
Output High Voltage I
OH
= -400 µA2.4V
AC Characteristics for Read Operation
Symbol Parameter Condition
AT27C4096
Units
-55 -70 -90 -12 -15
Min Max Min Max Min Max Min Max Min Max
t
ACC
(3)
Address to Output
Delay
CE = OE
= V
IL
55 70 90 120 150 ns
t
CE
(2)
CE to Output Delay OE = V
IL
55 70 90 120 150 ns
t
OE
(2)(3)
OE to Output Delay CE = V
IL
20 30 35 40 50 ns
t
DF
(4)(5)
OE or CE High to Output Float,
whichever occurred first
20 20 20 30 35 ns
t
OH
(4)
Output Hold from Address, CE or OE,
whichever occurred first
77000ns
AT27C4096
5
AC Waveforms for Read Operation
(1)
Notes: 1. Timing measurement references are 0.8V and 2.0V. Input AC drive levels are 0.45V and 2.4V, unless otherwise specified.
2. OE
may be delayed up to t
CE
- t
OE
after the falling edge of CE without impact on t
CE
.
3. OE may be delayed up to t
ACC
- t
OE
after the address is valid without impact on t
ACC
.
4. This parameter is only sampled and is not 100% tested.
5. Output float is defined as the point when data is no longer driven.
Input Test Waveforms and
Measurement Levels
For -55 devices only:
t
R
, t
F
< 5 ns (10% to 90%)
For -70, -90, -12 and -15 devices:
t
R
, t
F
< 20 ns (10% to 90%)
Output Test Load
Note: CL = 100 pF including jig capacitance, except for the -45
and -55 devices, where CL = 30 pF.
Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
OUTPUT
PIN
1.3V
(1N914)
3.3K
CL
Pin Capacitance
f = 1 MHz, T = 25°C
(1)
Symbol Typ Max Units Conditions
C
IN
410pFV
IN
= 0V
C
OUT
812pFV
OUT
= 0V
AT27C4096
6
Programming Waveforms
(1)
Notes: 1. The Input Timing Reference is 0.8V for V
IL
and 2.0V for V
IH
.
2. t
OE
and t
DFP
are characteristics of the device but must be accommodated by the programmer.
3. When programming the AT27C4096, a 0.1 µF capacitor is required across V
PP
and ground to suppress spurious voltage
transients.
DC Programming Characteristics
T
A
= 25
±
5°C, V
CC
= 6.5
±
0.25V, V
PP
= 13.0
±
0.25V
Symbol Parameter Test Conditions
Limits
UnitsMin Max
I
LI
Input Load Current V
IN
= V
IL
, V
IH
±
10
µ
A
V
IL
Input Low Level -0.6 0.8 V
V
IH
Input High Level 2.0 V
CC
+
0.7
V
V
OL
Output Low Voltage I
OL
= 2.1 mA 0.4 V
V
OH
Output High Voltage I
OH
= -400
µ
A2.4 V
I
CC2
V
CC
Supply Current
(Program and Verify)
50 mA
I
PP2
V
PP
Supply Current CE = V
IL
30 mA
V
ID
A9 Product Identification Voltage 11.5 12.5 V

AT27C4096-12JC

Mfr. #:
Manufacturer:
Microchip Technology / Atmel
Description:
EPROM 4M bit
Lifecycle:
New from this manufacturer.
Delivery:
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