TLP2631
2014-09-01
4
Switching Characteristics
(Ta = 25°C, V
CC
= 5V)
Characteristic Symbol
Test
Circuit
Test Condition Min Typ. Max Unit
Propagation delay time to
low output level
t
p
HL 1
I
F
= 0→7.5mA, R
L
= 350Ω
C
L
= 15pF (each channel)
― 60 75 ns
Propagation delay time to
high output level
t
p
LH 1
I
F
= 7.5mA→0, R
L
= 350Ω
C
L
= 15pF (each channel)
― 60 75 ns
Output rise time, output
fall time (10~90%)
t
r
, t
f
1
I
F
= 0 7.5mA, R
L
= 350Ω
C
L
= 15pF (each channel)
― 30 ― ns
Common mode transient
immunity at high output level
CM
H
2
I
F
= 0, R
L
= 350Ω
V
CM
= 400V,
V
O
(min.) = 2V
(each channel, Note 4)
1000 10000 ― V / μs
Common mode transient
immunity at low output level
CM
L
2
I
F
= 7.5mA, R
L
= 350Ω
V
CM
= 400V
V
O
(max.) = 0.8V
(each channel, Note 5)
−1000 −10000 ― V / μs
(Note 1) 2mm below seating plane
(Note 2) The V
CC
supply voltage to each TLP2631 isolator must be bypassed by a 0.1μF capacitor or larger. This
can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be
connected as close as possible to the package V
CC
and GND pins each device.
(Note 3) Device considered a two−terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8
shorted together.
(Note 4) CM
H
・the maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in
the high state (i.e. V
OUT
> 2.0V).
Measured in volts per microsecond (V / μs).
Volts/ microsecond can be translated to sinusoidal voltages:
(p.p.)
CM
V
CM
fMax.
dt
(dVCM)
μsV / ==
Example:
V
CM
= 319V
pp
when f
CM
= 1MHz using CM
L
and CM
H
= 1000V / μs data sheet specified minimum.
(Note 5) CM
L
・the maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in
the low output state (i.e. V
OUT
< 0.8V).
Measured in volts per microsecond (V / μs).
(Note 6) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together.