Spec No. JELF243B-0006Q-01 P.2/9
MURATA MFG.CO., LTD
Reference
Only
6. Electrical Performance
No. Item Specification Test Method
6.1 Inductance
Inductance shall meet item 3. Measuring Equipment:
Agilent 4291A or equivalent
(1mA)
Measuring Frequency: 1MHz
6.2 DC Resistance DC Resistance shall meet item 3. Measuring Equipment: Digital multi meter
DC resistance shall be measured after
putting chip coil between the terminal 2
under the condition of opening between
a and b.
Every measurement the terminal 1 shall
be shorted between a and b when
changing chip coil.
6.3 Self Resonant
Frequency
(S.R.F)
S.R.F shall meet item 3. Measuring Equipment:
Agilent 4291A or equivalent (1mA)
6.4 Rated Current Self temperature rise shall be limited
to 25°C max.
Inductance Change: within ±50%
The rated current is applied.
7. Mechanical Performance
No. Item Specification Test Method
7.1 Shear Test Chip coil shall not be damaged after
tested as follows.
Applied Direction
Force: 10N
Hold Duration: 5s±1s
Applied Direction: Parallel to PCB
7.2 Bending Test Substrate: Glass-epoxy substrate
(100mm×40mm×1.6mm)
(in mm)
Speed of Applying Force: 1mm / s
Deflection: 1mm
Hold Duration: 30s
7.3 Vibration Oscillation Frequency:
10Hz to 55Hz to 10Hz for 1 minute
Total Amplitude: 1.5mm
Testing Time:
A period of 2h in each of 3 mutually
perpendicular directions.
Digital multi meter
(TR6846 or equivalent)
terminal2terminal1
SW
a
b
F
Chip Coil
Substrate
45
R340
F
Deflection
45
Product
Pressure jig