7
FN8179.2
December 21, 2009
DC Electrical Specifications (Over recommended operating conditions unless otherwise specified.
SYMBOL PARAMETER TEST CONDITIONS
LIMITS
UNIT
MIN
(Note 9)
TYP
(Note 8)
MAX
(Note 9)
V
CC
Supply Voltage X9315 4.5 5.5 V
X9315-2.7 2.7 5.5 V
I
CC1
V
CC
active current (Increment) CS = V
IL
, U/D = V
IL
or V
IH
and INC = 0.4V
@ max. t
CYC
80 µA
I
CC2
V
CC
active current (Store) (EEPROM
Store)
CS = V
IH
, U/D = V
IL
or V
IH
and INC = V
IH
@
max. t
WR
400 µA
I
SB
Standby supply current CS = V
CC
- 0.3V, U/D and INC = V
SS
or V
CC
- 0.3V
5µA
I
LI
CS, INC, U/D input leakage current V
IN
= V
SS
to V
CC
-10 +10 µA
V
IH
CS, INC, U/D input HIGH voltage V
CC
x 0.7 V
CC
+ 0.5 V
V
IL
CS, INC, U/D input LOW voltage -0.5 V
CC
x 0.1 V
C
IN
CS, INC, U/D input capacitance V
CC
= 5V, V
IN
= V
SS
, T
A
= +25°C, f = 1MHz 10 pF
Endurance and Data Retention
PARAMETER MIN UNIT
Minimum endurance 100,000 Data changes per bit
Data retention 100 Years
Test Circuit #1 Test Circuit #2 Circuit #3 SPICE Macro Model
Test Point
V
W
/R
W
V
H
/R
H
V
L
/R
L
V
S
Force
Current
V
L
VW
Test Point
V
H
/R
H
V
W
/R
W
V
L
/R
L
C
H
C
L
R
W
10pF
10pF
R
H
R
L
R
TOTAL
C
W
25pF
AC Conditions of Test
Input pulse levels 0V to 3V
Input rise and fall times 10ns
Input reference levels 1.5V
AC Electrical Specifications (Over recommended operating conditions unless otherwise specified)
SYMBOL PARAMETER
LIMITS
UNIT
MIN
(Note 9)
TYP
(Note 8)
MAX
(Note 9)
t
Cl
CS to INC setup 100 ns
t
lD
INC HIGH to U/D change 100 ns
t
DI
U/D to INC setup 2.9 µs
t
lL
INC LOW period 1 µs
t
lH
INC HIGH period 1 µs
X9315
