TSH253
High Sensitivity Omni-Polar Hall Effect Switch
1/8
Version: C13
Description
TSH253 Hall-effect sensor is a temperature stable, stress-resistant switch. Superior high-temperature
performance is made possible through a dynamic offset cancellation that utilizes chopper-stabilization. This
method reduces the offset voltage normally caused by device over molding, temperature dependencies, and
thermal stress. TSH253 includes the following on a single silicon chip: voltage regulator, Hall voltage generator,
small-signal amplifier, chopper stabilization, Schmitt trigger, open-drain output. Advanced CMOS wafer fabrication
processing is used to take advantage of low-voltage requirements, component matching, very low input-offset
errors, and small component geometries.
Features
● CMOS Hall IC Technology
● Solid-State Reliability much better than reed switch
● Omni polar output switches with absolute value of
North or South pole from magnet
● Operation down to 1.8 V and Max at 6V.
● High Sensitivity for reed switch replacement
● ESD HBM ±4KV Min
Ordering Information
Part No. Package Packing
TSH253CT B0G TO-92S 1Kpcs / Bulk Bag
TSH253CX RFG SOT-23 3Kpcs / 7” Reel
Note: “G” denote for Halogen Free Product
Application
● Solid state switch, Revolution counter
● Lid close sensor for power supply devices
● Magnet proximity sensor for reed switch
replacement in high duty cycle applications.
● Safety Key on sporting equipment
● Speed sensor, Position Sensor, Rotation Sensor
Absolute Maximum Rating
(Ta = 25
o
C unless otherwise noted)
Limit Value
Supply voltage V
6
V
Output Voltage V
6
V
Reverse voltage V
-0.3
V
Magnetic flux density
Unlimited
Gauss
Output current I
1
mA
Operating Temperature Range
T
OPR
-40 to +85
o
C
Storage temperature range T
-55 to +150
C
Maximum Junction Temp T
150
C
Thermal Resistance - Junction to Ambient
TO-92S
θ
JA
206
o
C/W
SOT-23
543
Thermal Resistance - Junction to Case
TO-92S
θ
JC
148
o
C/W
SOT-23
410
Package Power Dissipation
TO-92S
P
D
606
mW
SOT-23
230
Note: Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute maximum-
rated conditions for extended periods may affect device reliability.
1. V
CC
2. GND
3. Output
1. V
CC
2. Output
3. GND
