74HC_HCT2G66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 10 — 3 October 2013 12 of 23
NXP Semiconductors 74HC2G66; 74HCT2G66
Dual single-pole single-throw analog switch
11.3 Test circuits and graphs
f
(3dB)
3 dB frequency
response
R
L
= 50 ; C
L
=10pF;
see Figure 14 and 15
V
CC
= 4.5 V - 180 - MHz
V
CC
= 9.0 V - 200 - MHz
iso
isolation (OFF-state) R
L
= 600 ; f
i
=1MHz;
see Figure 16 and 17
V
CC
= 4.5 V - 50 - dB
V
CC
= 9.0 V - 50 - dB
V
ct
crosstalk voltage between digital input and switch (peak
to peak value); R
L
=600; f
i
= 1 MHz;
see Figure 18
V
CC
= 4.5 V - 110 - mV
V
CC
= 9.0 V - 220 - mV
Xtalk crosstalk between switches; R
L
=600;
f
i
= 1 MHz; see Figure 19
V
CC
= 4.5 V - 60 - dB
V
CC
= 9.0 V - 60 - dB
Table 12. Additional dynamic characteristics for 74HC2G66 and 74HCT2G66 …continued
GND = 0 V; t
r
= t
f
= 6.0 ns; C
L
= 50 pF; unless otherwise specified. All typical values are measured at T
amb
=25
C.
Symbol Parameter Conditions Min Typ Max Unit
With f
i
= 1 MHz adjust the switch input voltage for a
0 dBm level at the switch output, (0 dBm = 1 mW into
50 ). Then Increase the input frequency until the dB
meter reads 3dB.
Fig 13. Test circuit for measuring total harmonic
distortion
Fig 14. Test circuit for measuring the 3 dB frequency
response
10 μF
2R
L
2R
L
C
L
f
i
V
IH
V
O
V
CC
V
CC
nE
D
nY/nZ nZ/nY
001aaj468
0.1 μF
2R
L
2R
L
C
L
f
i
V
IH
V
O
V
CC
V
CC
nE
dB
nY/nZ nZ/nY
001aaj469
74HC_HCT2G66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 10 — 3 October 2013 13 of 23
NXP Semiconductors 74HC2G66; 74HCT2G66
Dual single-pole single-throw analog switch
Test conditions: V
CC
= 4.5 V; GND = 0 V; R
L
=50;R
SOURCE
=1k.
Fig 15. Typical 3 dB frequency response
mna083
5
(dB)
5
10
f
i
(kHz)
10
5
10
6
10
4
10
2
10
3
0
Adjust the switch input voltage for a 0 dBm level (0 dBm = 1 mW into 600 )
Fig 16. Test circuit for measuring isolation (OFF-state)
0.1 μF
2R
L
2R
L
C
L
f
i
V
IL
V
O
V
CC
V
CC
nE
dB
nY/nZ nZ/nY
001aaj470
74HC_HCT2G66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 10 — 3 October 2013 14 of 23
NXP Semiconductors 74HC2G66; 74HCT2G66
Dual single-pole single-throw analog switch
Test conditions: V
CC
= 4.5 V; GND = 0 V; R
L
=50;R
SOURCE
=1k.
Fig 17. Typical isolation (OFF-state) as a function of frequency
mna082
60
40
80
20
0
(dB)
100
10
f
i
(kHz)
10
5
10
6
10
4
10
2
10
3
a. Circuit
b. Crosstalk voltage
Adjust the switch input voltage for a 0 dBm level (0 dBm = 1 mW into 600 )
Fig 18. Test circuit for measuring crosstalk voltage (between the digital input and the switch)
DUT
mnb011
2R
L
2R
L
2R
L
2R
L
nZ/nYnY/nZ
C
L
oscilloscope
V
CC
nE V
CC
V
CC
GND
GND
mnb012
V(pp)

74HCT2G66DC,125

Mfr. #:
Manufacturer:
Nexperia
Description:
Analog Switch ICs Analog SW Dual SPST 5.5V 8-Pin
Lifecycle:
New from this manufacturer.
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