digital spikes, sags, and surges which can adversely affect
the QT113. The QT113 will track slow changes in Vdd, but it
can be affected by rapid voltage steps.
if desired, the supply can be regulated using a conventional
low current regulator, for example CMOS regulators that have
low quiescent currents.
3.5 ESD PROTECTION
In cases where the electrode is placed behind a dielectric
panel, the QT113 will usually be adequately protected from
direct static discharge. However, even with a plastic or glass
panel, transients can still flow into the electrode via induction,
or in extreme cases, via dielectric breakdown. Porous
materials may allow a spark to tunnel right through the
material; partially conducting materials like 'pink poly' will
conduct the ESD right to the electrode. Testing is required to
reveal any problems. The QT113 does have diode protection
on its terminals which can absorb and protect the device from
most induced discharges, up to 20mA; the usefulness of the
internal clamping will depending on the dielectric properties,
panel thickness, and rise time of the ESD transients.
ESD dissipation can be aided further with an added diode
protection network as shown in Figure 3-1, in extreme cases.
Because the charge and transfer times of the QT113
are relatively long, the circuit can tolerate very large
values of Re, even to 100k ohms in most cases where
electrode Cx is small. The added diodes shown
(1N4150 or equivalent low-C diodes, or a single BAV99
dual-diode) will shunt the ESD transients away from the
part, and Re1 will current limit the rest into the QT113's
own internal clamp diodes. C1 should be around 10µF
if it is to absorb positive transients from a human body
model standpoint without rising in value by more than 1
volt. If desired C1 can be replaced with an appropriate
Zener diode. Directly placing semiconductor transient
protection devices, Zeners, or MOV's on the sense lead
is not advised; these devices have extremely large
amounts of unstable parasitic C which will swamp the
QT113 and render it useless.
Re1 should be as large as possible given the load
value of Cx and the diode capacitances of D1 and D2,
but Re1 should be low enough to permit at least 6
timeconstants of RC to occur during the charge and transfer
phases.
Re2 functions to isolate the transient from the QT113's Vdd
pin; values of around 1K ohms are reasonable.
As with all ESD protection networks, it is crucial that the
transients be led away from the circuit. PCB ground layout is
crucial; the ground connections to D1, D2, and C1 should all
go back to the power supply ground or preferably, if
available, a chassis ground connected to earth. The currents
should not be allowed to traverse the area directly under the
QT113.
If the QT113 is connected to an external circuit via a cable or
long twisted pair, it is possible for ground-bounce to cause
damage to the Out pin; even though the transients are led
away from the QT113 itself, the connected signal or power
ground line will act as an inductor, causing a high differential
voltage to build up on the Out wire with respect to ground. If
this is a possibility, the Out pin should have a resistance Re3
in series with it to limit current; this resistor should be as
large as can be tolerated by the load.
- 7 -
Figure 3-1 ESD Suppression Circuit
3
46
5
1
+2.5 to 5
72
OUT
OPT1
OPT2
GAIN
SNS1
SNS2
Vss
Vdd
8
R
C
D
D
R
R
e3
s
2
1
e2
e1
SENSIN G
ELECTRODE
10µF
+
C1
4.1 ABSOLUTE MAXIMUM SPECIFICATIONS
Operating temp ............................................................ as designated by suffix
Storage temp ................................................................... -55
O
C to +125
O
C
V
DD
...............................................................................-0.5 to +6.5V
Max continuous pin current, any control or drive pin ............................................ ±20mA
Short circuit duration to ground, any pin ....................................................... infinite
Short circuit duration to V
DD
, any pin ......................................................... infinite
Voltage forced onto any pin ................................................. -0.6V to (Vdd + 0.6) Volts
4.2 RECOMMENDED OPERATING CONDITIONS
VDD ............................................................................... +2.5 to 5.5V
Short-term supply ripple+noise ...............................................................±5mV
Long-term supply stability ................................................................ ±100mV
Cs value ......................................................................... 10nF to 500nF
Cx value ............................................................................ 0 to 100pF
4.3 AC SPECIFICATIONS
Vdd = 3.0, Ta = recommended operating range
, Cs=100nF unless noted
µs300Heartbeat pulse widthT
HB
Cx = 10pF; See Figure 4-3ms30Response timeT
R
Cs = 10nF to 500nF; Cx = 0ms750.5Burst lengthT
BL
Cs = 10nF to 500nF; Cx = 0ms802.1Burst spacing intervalT
BS
µs2Transfer durationT
PT
µs2Charge durationT
PC
ms550Recalibration timeT
RC
NotesUnitsMaxTypMinDescriptionParameter
4.4 SIGNAL PROCESSING
Option pin selectedsecs10, 60, infinitePost-detection recalibration timer duration
ms/level100Negative drift compensation rate
ms/level1,000Positive drift compensation rate
samples3Consensus filter length
Note 1%17Hysteresis
Option pin selectedcounts6 or 12Threshold differential
NotesUnitsMaxTypMinDescription
Note 1: Percentage of signal threshold
- 8 -
4.5 DC SPECIFICATIONS
Vdd = 3.0V, Cs = 10nF, Cx = 5pF, T
A
= recommended range, unless otherwise noted
Note 2fF281,000Sensitivity rangeS
bits14Acquisition resolutionA
R
Resistance from SNS1 to SNS2
1MMin shunt resistanceI
X
pF1000Load capacitance rangeC
X
OPT1, OPT2µA±1Input leakage currentI
IL
OUT, 1mA sourceVVdd-0.7High output voltageV
OH
OUT, 4mA sinkV0.6Low output voltageV
OL
OPT1, OPT2V2.2High input logic levelV
HL
OPT1, OPT2V0.8Low input logic levelV
IL
Required for proper startupV/s100Supply turn-on slopeV
DDS
µA1,500600Supply currentI
DD
V5.252.45Supply voltageV
DD
NotesUnitsMaxTypMinDescriptionParameter
Note 2: Sensitivity depends on value of Cx and Cs. Refer to Figures 4-1, 4-2.
- 9 -
Figure 4-1 - Typical Threshold Sensitivity vs. Cx,
High Gain, at Selected Values of Cs; Vdd = 3.0
0.01
0.10
1.00
10.00
0 10203040
Cx Load, pF
Detection Threshold, pF
10nF
20nF
50nF
100nF
200nF
500nF
Figure 4-2 - Typical Threshold Sensitivity vs. Cx,
Low Gain, at Selected Values of Cs; Vdd = 3.0
0.01
0.10
1.00
10.00
0 10203040
Cx Load, pF
Detection Threshold, pF
10nF
20nF
50nF
100nF
200nF
500nF

QT113H-IS

Mfr. #:
Manufacturer:
Description:
SENSOR IC TOUCH/PROXMTY 1CH8SOIC
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