AS7C31025C-12TJINTR

AS7C31025C
9/20/06, v. 1.0 Alliance Memory P. 4 of 9
®
Read cycle (over the operating range)
3,9
Key to switching waveforms
Read waveform 1 (address controlled)
3,6,7,9
Read waveform 2 (CE and OE controlled)
3,6,8,9
Parameter Symbol
AS7C31025C-10
Unit NotesMin Max
Read cycle time t
RC
12 - ns
Address access time t
AA
–12ns3
Chip enable (
CE
) access time t
ACE
–12ns3
Output enable (
OE
) access time t
OE
6ns
Output hold from address change t
OH
4–ns5
CE
low to output in low Z t
CLZ
4 ns 4, 5
CE
high to output in high Z t
CHZ
0 5 ns 4, 5
OE
low to output in low Z t
OLZ
0 ns 4, 5
OE
high to output in high Z t
OHZ
0 5 ns 4, 5
Power up time t
PU
0 ns 4, 5
Power down time t
PD
–12ns4, 5
Undefined/don’t careFalling inputRising input
Address
D
OUT
Data valid
t
OH
t
AA
t
RC
current
Supply
OE
D
OUT
t
OE
t
OLZ
t
ACE
t
CHZ
t
CLZ
t
PU
t
PD
I
CC
I
SB
50% 50%
Data valid
t
RC1
CE
t
OHZ
AS7C31025C
9/20/06, v. 1.0 Alliance Memory P. 5 of 9
®
Write cycle (over the operating range)
11
Write waveform 1 (WE controlled)
10,11
Write waveform 2 (CE controlled)
10,11
Parameter Symbol
AS7C31025C-10
Unit NotesMin Max
Write cycle time t
WC
12 - ns
Chip enable (
CE
) to write end t
CW
8ns
Address setup to write end t
AW
8ns
Address setup time t
AS
0–ns
Write pulse width t
WP
8ns
Write recovery time t
WR
0–ns
Address hold from end of write t
AH
0–ns
Data valid to write end t
DW
6ns
Data hold time t
DH
0 ns 4, 5
Write enable to output in high Z t
WZ
0 5 ns 4, 5
Output active from write end t
OW
3 ns 4, 5
t
AW
t
AH
t
WC
Address
WE
D
OUT
t
DH
t
OW
t
DW
t
WZ
t
WP
t
AS
Data valid
D
IN
t
WR
t
AW
Address
CE
WE
D
OUT
t
CW
t
WP
t
DW
t
DH
t
AH
t
WZ
t
WC
t
AS
Data valid
D
IN
t
WR
AS7C31025C
9/20/06, v. 1.0 Alliance Memory P. 6 of 9
®
AC test conditions
Notes
1 During V
CC
power-up, a pull-up resistor to V
CC
on
CE
is required to meet I
SB
specification.
2 This parameter is sampled, but not 100% tested.
3 For test conditions, see AC Test Conditions, Figures A and B.
4t
CLZ
and t
CHZ
are specified with CL = 5 pF, as in Figure B. Transition is measured ±200 mV from steady-state voltage.
5 This parameter is guaranteed, but not 100% tested.
6
WE
is high for read cycle.
7
CE
and
OE
are low for read cycle.
8 Address is valid prior to or coincident with
CE
transition low.
9 All read cycle timings are referenced from the last valid address to the first transitioning address.
10 N/A
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 N/A.
13 C = 30 pF, except all high Z and low Z parameters where C = 5 pF.
255
Ω
Output load: see Figure B.
Input pulse level: GND to 3.0 V. See Figure A.
Input rise and fall times: 3 ns. See Figure A.
Input and output timing reference levels: 1.5 V.
C
13
320
Ω
D
OUT
GND
+3.3 V
168
Ω
Thevenin equivalent:
D
OUT
+1.728 V
Figure B: 3.3 V Output load
10%
90%
10%
90%
GND
+3.0 V
Figure A: Input pulse
3 ns

AS7C31025C-12TJINTR

Mfr. #:
Manufacturer:
Alliance Memory
Description:
SRAM 1M, 3.3V, 12ns FAST 128K x 8 Asynch SRAM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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