LIS244AL Mechanical and electrical specifications
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2.3 Absolute maximum ratings
Stresses above those listed as “absolute maximum ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
2.4 Terminology
Sensitivity describes the gain of the sensor and can be determined by applying 1g
acceleration to it. As the sensor can measure DC accelerations this can be done easily by
pointing the axis of interest towards the center of the earth, note the output value, rotate the
sensor by 180 degrees (point to the sky) and note the output value again thus applying ±1g
acceleration to the sensor. Subtracting the larger output value from the smaller one and
dividing the result by 2 will give the actual sensitivity of the sensor. This value changes very
little over temperature (see sensitivity change vs. temperature) and also very little over time.
The sensitivity tolerance describes the range of sensitivities of a large population of sensors.
Zero-g level describes the actual output signal if there is no acceleration present. A sensor
in a steady state on a horizontal surface will measure 0g in X axis and 0g in Y axis. The
output is ideally for a 3.0V powered sensor Vdd/2 = 1500mV. A deviation from ideal 0-g level
(1500mV in this case) is called Zero-g offset. Offset of precise MEMS sensors is to some
extend a result of stress to the sensor and therefore the offset can slightly change after
mounting the sensor onto a printed circuit board or exposing it to extensive mechanical
stress. Offset changes little over temperature - see “Zero-g level change vs. temperature” -
the Zero-g level of an individual sensor is very stable over lifetime. The Zero-g level
tolerance describes the range of Zero-g levels of a population of sensors.
Table 5. Absolute maximum ratings
Symbol Ratings Maximum value Unit
Vdd Supply voltage -0.3 to 6 V
Vin Input voltage on any control pin (ST) -0.3 to Vdd +0.3 V
A
POW
Acceleration (any axis, powered, Vdd=3.0V)
3000g for 0.5 ms
10000g for 0.1 ms
A
UNP
Acceleration (any axis, not powered)
3000g for 0.5 ms
10000g for 0.1 ms
T
STG
Storage temperature range -40 to +125 °C
This is a Mechanical Shock sensitive device, improper handling can cause permanent
damages to the part
This is an ESD sensitive device, improper handling can cause permanent damages to the
part
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Mechanical and electrical specifications LIS244AL
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Self Test allows to test the mechanical and electric part of the sensor, allowing the seismic
mass to be moved by means of an electrostatic test-force. The Self Test function is off when
the ST pin is connected to GND. When the ST pin is tied at Vdd an actuation force is applied
to the sensor, simulating a definite input acceleration. In this case the sensor outputs will
exhibit a voltage change in their DC levels which is depending on the supply voltage through
the device sensitivity. When ST is activated, the device output level is given by the algebraic
sum of the signals produced by the acceleration acting on the sensor and by the
electrostatic test-force. If the output signals change within the amplitude specified inside
Table 3 , than the sensor is working properly and the parameters of the interface chip are
within the defined specification.
Output impedance describes the resistor inside the output stage of each channel. This
resistor is part of a filter consisting of an external capacitor of at least 2.5nF and the internal
resistor. Due to the resistor level, only small inexpensive external capacitors are needed to
generate low corner frequencies. When interfacing with an ADC it is important to use high
input impedance input circuitries to avoid measurement errors. Note that the minimum load
capacitance forms a corner frequency close to the resonance frequency of the sensor. In
general the smallest possible bandwidth for a particular application should be chosen to get
the best results.
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LIS244AL Functionality
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3 Functionality
The LIS244AL is an ultra compact low-power, analog output two-axis linear accelerometer
packaged in a LGA package. The complete device includes a sensing element and an IC
interface able to take the information from the sensing element and to provide an analog
signal to the external world.
3.1 Sensing element
A proprietary process is used to create a surface micro-machined accelerometer. The
technology allows to carry out suspended silicon structures which are attached to the
substrate in a few points called anchors and are free to move in the direction of the sensed
acceleration. To be compatible with the traditional packaging techniques a cap is placed on
top of the sensing element to avoid blocking the moving parts during the moulding phase of
the plastic encapsulation.
When an acceleration is applied to the sensor the proof mass displaces from its nominal
position, causing an imbalance in the capacitive half-bridge. This imbalance is measured
using charge integration in response to a voltage pulse applied to the sense capacitor.
At steady state the nominal value of the capacitors are few pF and when an acceleration is
applied the maximum variation of the capacitive load is in pF range.
3.2 IC Interface
The complete signal processing uses a fully differential structure, while the final stage
converts the differential signal into a single-ended one to be compatible with the external
world.
The first stage is a low-noise capacitive amplifier that implements a Correlated Double
Sampling (CDS) at its output to cancel the offset and the 1/f noise. The produced signal is
then sent to two different S&Hs, one for each channel, and made available to the outside.
All the analog parameters (output offset voltage and sensitivity) are ratiometric to the
voltage supply. Increasing or decreasing the voltage supply, the sensitivity and the offset will
increase or decrease linearly. The feature provides the cancellation of the error related to
the voltage supply along an analog to digital conversion chain.
3.3 Factory calibration
The IC interface is factory calibrated for sensitivity (So) and Zero-g level (Voff).
The trimming values are stored inside the device by a non volatile structure. Any time the
device is turned on, the trimming parameters are downloaded into the registers to be
employed during the normal operation. This allows the user to employ the device without
further calibration.
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LIS244ALTR

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
ACCELEROMETER 2-6G ANALOG 16LGA
Lifecycle:
New from this manufacturer.
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