Sheet No.: D2-A05302EN
7
PC900V0NSZXF Series
Fig.1 Test Circuit for Response Time
5V
1.5V
Amp
t
r
=t
f
=0.01µs
Z
O
=50
V
IN
47
0.1µF
V
O
280
V
IN
t
PHL
t
PLH
V
OH
90%
10%
t
r
V
OL
50%
V
O
Voltage
regulator
t
f
10
20
60
50
40
30
0
025 25 50 75 10085
Ambient temperature T
a
(˚C)
Forward current I
F
(mA)
50˚C
25˚C
0˚C
0
1
10
100
0.5 1.0 1.5 2.0 2.5 3.0
25˚C
Forward voltage V
F
(V)
Forward current I
F
(mA)
T
a
=75˚C
0
25
100
025507585 100
50
150
200
170
Ambient temperature T
a
(˚C)
Power dissipation P
O
, P
tot
(mW)
P
tot
P
O
Fig.3 Power Dissipation vs. Ambient
Temperature
Fig.5 Relative Input Threshold Current vs.
Supply Voltage
Fig.4 Forward Current vs. Forward Voltage
Fig.2 Forward Current vs. Ambient
Temperature
0.2
0.4
0.6
1.4
51001520
1.2
1.0
0.8
Supply voltage V
CC
(V)
Relative input threshold current I
FHL
, I
FLH
T
a
=25˚C
I
FHL
=1 at V
CC
=5V
I
FHL
I
FLH
Sheet No.: D2-A05302EN
8
PC900V0NSZXF Series
Fig.7 Low Level Output Voltage vs. Low
Level Output Current
Fig.6 Relative Input Threshold Current vs.
Ambient Temperature
Fig.9 Supply Current vs. Supply Voltage
Fig.11
Rise Time, Fall Time vs. Load
Resistance
Fig.10
Propagation Delay Time vs. Forward
Current
Fig.8 Low Level Output Voltage vs. Ambient
Temperature
0
1
2
9
517113
5
4
3
6
7
8
11 15793
25˚C
85˚C
25˚C
85˚C
Supply voltage V
CC
(V)
Supply current I
CC
(mA)
T
a
= 25˚C
T
a
= 25˚C
I
CCL
{
I
CCH
{
0.2
0.4
Relative input threshold current I
FHL
, I
FLH
0.6
0.8
1.6
025507525 100
1.4
1.2
1
Ambient temperature T
a
(˚C)
I
FHL
=1 at T
a
=25˚C
I
FLH
I
FHL
V
CC
=5V
0.01
1
0.1
1
10 100
Low level output current I
OL
(mA)
Low level output voltage V
OL
(V)
V
CC
=5V
T
a
=25˚C
0.2
0.3
0.5
025 25 50 100
0.1
0
0.4
75
16mA
5mA
Low level output voltage V
OL
(V)
Ambient temperature T
a
(˚C)
V
CC
=5V
I
OL
=30mA
0
0.1
0.1
0.2
0.3
0.4
0.5
110
Load resistance R
L
(k)
t
f
t
r
Rise time, fall time t
r
, t
f
(µs)
V
CC
=5V
I
F
=4mA
T
a
=25˚C
0
1
2
3
4
5
10 20 30 40 60050
Forward current I
F
(mA)
Propagation delay time t
PHL
, t
PLH
(µs)
V
CC
=5V
R
L=280
T
a
=25˚C
t
PLH
t
PHL
Remarks : Please be aware that all data in the graph are just for reference and not for guarantee.
Sheet No.: D2-A05302EN
9
PC900V0NSZXF Series
Design Considerations
Transistor of detector side in bipolar configuration may be damaged by static electricity due to its minute
design.
When handling these devices, general countermeasure against static electricity should be taken to avoid
breakdown of devices or degradation of characteristics.
Notes about static electricity
In order to stabilize power supply line, we should certainly recommend to connect a by-pass capacitor of
0.01µF or more between V
CC
and GND near the device.
The detector which is used in this device, has parasitic diode between each pins and GND.
There are cases that miss operation or destruction possibly may be occurred if electric potential of any pin
becomes below GND level even for instant.
Therefore it shall be recommended to design the circuit that electric potential of any pin does not become
below GND level.
This product is not designed against irradiation and incorporates non-coherent IRED.
Design guide
Degradation
In general, the emission of the IRED used in photocouplers will degrade over time.
In the case of long term operation, please take the general IRED degradation (50% degradation over 5
years) into the design consideration.
Please decide the input current which become 2 times of MAX. I
FHL
.

PC900V0NSZXF

Mfr. #:
Manufacturer:
Sharp Microelectronics
Description:
High Speed Optocouplers Photocoupler DC In Digital out
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet