IRFZ46NS
IRFZ46NL
HEXFET
®
Power MOSFETl Advanced Process Technology
l Surface Mount (IRFZ46NS)
l Low-profile through-hole (IRFZ46NL)
l 175°C Operating Temperature
l Fast Switching
l Fully Avalanche Rated
Parameter Typ. Max. Units
R
θJC
Junction-to-Case  1.4
R
θJA
Junction-to-Ambient ( PCB Mounted,steady-state)** 40
Thermal Resistance
°C/W
Parameter Max. Units
I
D
@ T
C
= 25°C Continuous Drain Current, V
GS
@ 10V 53
I
D
@ T
C
= 100°C Continuous Drain Current, V
GS
@ 10V 37 A
I
DM
Pulsed Drain Current  180
P
D
@T
A
= 25°C Power Dissipation 3.8 W
P
D
@T
C
= 25°C Power Dissipation 107 W
Linear Derating Factor 0.71 W/°C
V
GS
Gate-to-Source Voltage ± 20 V
I
AR
Avalanche Current 28 A
E
AR
Repetitive Avalanche Energy 11 mJ
dv/dt Peak Diode Recovery dv/dt  5.0 V/ns
T
J
Operating Junction and -55 to + 175
T
STG
Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
°C
Absolute Maximum Ratings
Advanced HEXFET
®
Power MOSFETs from International
Rectifier utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This benefit,
combined with the fast switching speed and ruggedized
device design that HEXFET power MOSFETs are well known
for, provides the designer with an extremely efficient and
reliable device for use in a wide variety of applications.
The D
2
Pak is a surface mount power package capable of
accommodating die sizes up to HEX-4. It provides the highest
power capability and the lowest possible on-resistance in
any existing surface mount package. The D
2
Pak is suitable
for high current applications because of its low internal
connection resistance and can dissipate up to 2.0W in a
typical surface mount application.
The through-hole version (IRFZ46NL) is available for low-
profile applications.
Description
V
DSS
= 55V
R
DS(on)
= 0.0165
I
D
= 53A
2
D Pak
TO-262
S
D
G
04/08/04
www.irf.com 1
PD - 91305C
IRFZ46NS/IRFZ46NL
2 www.irf.com
Starting T
J
= 25°C, L = 389µH
R
G
= 25, I
AS
= 28A. (See Figure 12)
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Notes:
** When mounted on 1" square PCB (FR-4 or G-10 Material ).
For recommended footprint and soldering techniques refer to application note #AN-994.
I
SD
28A, di/dt 220A/µs, V
DD
V
(BR)DSS
,
T
J
175°C.
Pulse width 400µs; duty cycle 2%.
Uses IRFZ46N data and test conditions.
This is a typical value at device destruction and represents
operation outside rated limits.
This is a calculated value limited to TJ = 175°C.
Calculated continuous current based on maximum allowable
junction temperature. Package limitation current is 39A.
Parameter Min. Typ. Max. Units Conditions
I
S
Continuous Source Current MOSFET symbol
(Body Diode)
 
showing the
I
SM
Pulsed Source Current integral reverse
(Body Diode)
 
p-n junction diode.
V
SD
Diode Forward Voltage   1.3 V T
J
= 25°C, I
S
= 28A, V
GS
= 0V
t
rr
Reverse Recovery Time  67 101 ns T
J
= 25°C, I
F
= 28A
Q
rr
Reverse Recovery Charge  208 312 nC di/dt = 100A/µs

t
on
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by L
S
+L
D
)
Source-Drain Ratings and Characteristics
A
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
Drain-to-Source Breakdown Voltage 55   V V
GS
= 0V, I
D
= 250µA
V
(BR)DSS
/T
J
Breakdown Voltage Temp. Coefficient  0.057  V/°C Reference to 25°C, I
D
=1mA
R
DS(on)
Static Drain-to-Source On-Resistance   .0165 V
GS
=10V, I
D
= 28A
V
GS(th)
Gate Threshold Voltage 2.0  4.0 V V
DS
= V
GS
, I
D
= 250µA
g
fs
Forward Transconductance 19   S V
DS
= 25V, I
D
= 28A
  25
µA
V
DS
= 55V, V
GS
= 0V
  250 V
DS
= 44V, V
GS
= 0V, T
J
= 150°C
Gate-to-Source Forward Leakage   100 V
GS
= 20V
Gate-to-Source Reverse Leakage   -100
nA
V
GS
= -20V
Q
g
Total Gate Charge   72 I
D
= 28A
Q
gs
Gate-to-Source Charge   11 nC V
DS
= 44V
Q
gd
Gate-to-Drain ("Miller") Charge   26 V
GS
= 10V, See Fig. 6 and 13 
t
d(on)
Turn-On Delay Time  14  V
DD
= 28V
t
r
Rise Time  76  I
D
= 28A
t
d(off)
Turn-Off Delay Time  52  R
G
= 12
t
f
Fall Time  57  R
D
= 0.98Ω, See Fig. 10
Between lead,
 
and center of die contact
C
iss
Input Capacitance  1696  V
GS
= 0V
C
oss
Output Capacitance  407  pF V
DS
= 25V
C
rss
Reverse Transfer Capacitance  110  = 1.0MHz, See Fig. 5
E
AS
Single Pulse Avalanche Energy  583152 I
AS
= 28A, L = 389mH
Electrical Characteristics @ T
J
= 25°C (unless otherwise specified)
I
GSS
ns
I
DSS
Drain-to-Source Leakage Current
nH
7.5
L
S
Internal Source Inductance
53
180
S
D
G
IRFZ46NS/IRFZ46NL
www.irf.com 3
Fig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
1
10
100
1000
0.1 1 10 100
I , Drain-to-Source Current (A)
D
V , Drain-to-Source Voltage (V)
DS
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
20µs PULSE WIDTH
T = 25°C
C
A
4.5V
1
10
100
1000
0.1 1 10 100
4.5V
I , Drain-to-Source Current (A)
D
V , Drain-to-Source Voltage (V)
DS
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
20µs PULSE WIDTH
T = 175°C
C
A
0.0
0.5
1.0
1.5
2.0
2.5
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
J
T , Junction Temperature (°C)
R , Drain-to-Source On Resistance
DS(on)
(Normalized)
V = 10V
GS
A
I = 46A
D
1
10
100
1000
45678910
T = 25°C
J
GS
V , Gate-to-Source Voltage (V)
D
I , Drain-to-Source Current (A)
T = 175°C
J
A
V = 25V
20µs PULSE WIDTH
DS
Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 2. Typical Output Characteristics
T
J
= 25°C
T
J
= 175°C

IRFZ46NL

Mfr. #:
Manufacturer:
Infineon Technologies
Description:
MOSFET N-CH 55V 53A TO-262
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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