GENNUM CORPORATION 22212 - 3
4 of 12
GS9064
2. ELECTRICAL CHARACTERISTICS
2.1 ABSOLUTE MAXIMUM RATINGS
PARAMETER VALUE
Supply Voltage -0.5V to +3.6 V
DC
Input ESD Voltage 500V
Storage Temperature Range -50°C< T
s
< 125°C
Input Voltage Range (any input) -0.3 to (V
CC
+ 0.3)V
Operating Temperature Range 0°C to 70°C
Power Dissipation 300mW
Lead Temperature (soldering, 10 sec.) 260°C
Moisture Sensitivity Level 2
2.2 DC ELECTRICAL CHARACTERISTICS
V
CC
= 3.3V , V
EE
= 0V , T
A
= 0°C to 70°C, 270Mb/s, unless otherwise shown
PARAMETER SYMBOL CONDITIONS MIN TYPICAL MAX UNITS
TEST
LEVEL NOTES
Supply Voltage V
CC
3.1 3.3 3.5 V 1 -
Power Consumption P
D
T
A
= 25°C - 265 - mW 5 -
Supply Current Ι
S
T
A
= 25°C - 80 - mA 1 -
Input Common Mode Voltage V
CMIN
-1.75-V10-
Output Common Mode Voltage V
CMOUT
-V
CC
- ΔV
SDO
/2 - mV 7 -
CLI DC Voltage Cable length = 0m - 2.5 - V 1 -
No signal (max
cable length)
-1.9-V7-
Floating MCLADJ DC Voltage - 1.3 - V 7 -
MCLADJ Range 0m to max cable
length
-0.69-V7-
CD
/Mute Output Voltage V
CD/Mute(OH)
Carrier not present 2.6 - - V 1 -
V
CD/Mute(OL)
Carrier present - - 1.2 1 -
CD
/Mute Input Voltage
Required to Force Outputs to
Mute
V
CD/Mute)
Min to Mute 3.0 - - V 7 -
CD
/Mute Input Voltage
Required to Force Outputs to
Activate
V
CD/Mute
Max to Activate - - 2.0 V 7 -
TEST LEVELS
1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using
correlated test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1, 2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.
9. Indirect test.
10. Wafer Probe
