6.42
IDT70V9359/49L
High-Speed 3.3V 8/4K x 18 Dual-Port Synchronous Pipelined Static RAM Industrial and Commercial Temperature Ranges
7
AC Test Conditions
Figure 1. AC Output Test load.
Figure 3. Typical Output Derating (Lumped Capacitive Load).
1
2
3
4
5
6
7
8
20 40 10060 80 120 140 160 180 200
tCD
1
,
tCD
2
(Typical, ns)
Capacitance (pF)
5638 drw 06
-1
0
- 10pF is the I/O capacitance
of this device, and 30pF is the
AC Test Load Capacitance
.
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
GND to 3.0V
2ns Max.
1.5V
1.5V
Figures 1, 2, and 3
5638 tbl 10
5638 drw 05
590
30pF
435
3.3V
DATA
OUT
590
5pF*
435
3.3V
DATA
OUT
5638 drw 04
Figure 2. Output Test Load
(For t
CKLZ, tCKHZ, tOLZ, and tOHZ).
*Including scope and jig.
6.42
IDT70V9359/49L
High-Speed 3.3V 8/4K x 18 Dual-Port Synchronous Pipelined Static RAM Industrial and Commercial Temperature Ranges
8
AC Electrical Characteristics Over the Operating Temperature Range
(Read and Write Cycle Timing)
(3)
( VDD= 3.3V ± 0.3V)
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). This parameter is guaranteed by device characteriza-
tion, but is not production tested.
2. The Pipelined output parameters (t
CYC2, tCD2) apply to either or both the Left and Right ports when FT/PIPE = VIH. Flow-through parameters (tCYC1, tCD1) apply
when FT/PIPE = V
IL for that port.
3. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable (OE), FT/PIPE
R, and FT/PIPEL.
70V9359/49L6
Com'l Only
70V9359/49L7
Com'l & Ind
70V9359/49L9
Com'l Only
Symbol Parameter Min.Max.Min.Max.Min.Max.Unit
t
CYC1
Clock Cycle Time (Flow-Through)
(2 )
19
____
22
____
25
____
ns
t
CYC2
Clock Cycle Time (Pipelined)
(2 )
10
____
12
____
15
____
ns
t
CH1
Clock High Time (Flow-Through)
(2 )
6.5
____
7.5
____
12
____
ns
t
CL 1
Clock Low Time (Flow-Through)
(2 )
6.5
____
7.5
____
12
____
ns
t
CH2
Clock High Time (Pipelined)
(2 )
4
____
5
____
6
____
ns
t
CL 2
Clock Low Time (Pipelined)
(2 )
4
____
5
____
6
____
ns
t
R
Clock Rise Time
____
3
____
3
___ _
3ns
t
F
Clock Fall Time
____
3
____
3
___ _
3ns
t
SA
Address Setup Time 3.5
____
4
____
4
____
ns
t
HA
Address Hold Time 0
____
0
____
1
____
ns
t
SC
Chip Enable Setup Time 3.5
____
4
____
4
____
ns
t
HC
Chip Enable Hold Time 0
____
0
____
1
____
ns
t
SB
Byte Enable Setup Time 3.5
____
4
____
4
____
ns
t
HB
Byte Enable Hold Time 0
____
0
____
1
____
ns
t
SW
R/W Setup Time 3.5
____
4
____
4
____
ns
t
HW
R/W Hold Time 0
____
0
____
1
____
ns
t
SD
Input Data Setup Time 3.5
____
4
____
4
____
ns
t
HD
Input Data Hold Time 0
____
0
____
1
____
ns
t
SAD
ADS Setup Time
3.5
____
4
____
4
____
ns
t
HA D
ADS Hold Time
0
____
0
____
1
____
ns
t
SCN
CNTEN Setup Time
3.5
____
4
____
4
____
ns
t
HCN
CNTEN Hold Time
0
____
0
____
1
____
ns
t
SRST
CNTRST Setup Time
3.5
____
4
____
4
____
ns
t
HRST
CNTRST Hold Time
0
____
0
____
1
____
ns
t
OE
Output Enable to Data Valid
____
6.5
____
7.5
___ _
9ns
t
OLZ
Output Enable to Output Low-Z
(1 )
2
____
2
____
2
____
ns
t
OHZ
Output Enable to Output High-Z
(1 )
171717ns
t
CD1
Clock to Data Valid (Flow-Through)
(2 )
____
15
____
18
___ _
20 ns
t
CD2
Clock to Data Valid (Pipelined)
(2 )
____
6.5
____
7.5
___ _
9ns
t
DC
Data Output Hold After Clock High 2
____
2
____
2
____
ns
t
CKHZ
Clock High to Output High-Z
(1 )
292929ns
t
CKLZ
Clock High to Output Low-Z
(1 )
2
____
2
____
2
____
ns
Port-to-Port Delay
t
CWD D
Write Port Clock High to Read Data Delay
____
24
____
28
___ _
35 ns
t
CCS
Clock-to-Clock Setup Time
____
9
____
10
___ _
15 ns
5638 tbl 1
1
6.42
IDT70V9359/49L
High-Speed 3.3V 8/4K x 18 Dual-Port Synchronous Pipelined Static RAM Industrial and Commercial Temperature Ranges
9
Timing Waveform of Read Cycle for Flow-Through Output
(FT/PIPE
"X" = VIL)
(3,7)
Timing Waveform of Read Cycle for Pipelined Operation
(FT/PIPE
"X" = VIH)
(3,7)
An An + 1 An + 2 An + 3
t
CYC1
t
CH1
t
CL1
R/
W
ADDRESS
DATA
OUT
CE
0
CLK
OE
t
SC
t
HC
t
CD1
t
CKLZ
Qn Qn + 1 Qn + 2
t
OHZ
t
OLZ
t
OE
t
CKHZ
5638 drw 07
(1)
(1)
(1)
(1)
(2)
CE
1
UB, LB
t
SB
t
HB
t
SW
t
HW
t
SA
t
HA
t
DC
t
DC
(5)
t
SC
t
HC
t
SB
t
HB
An An + 1 An + 2 An + 3
t
CYC2
t
CH2
t
CL2
R/W
ADDRESS
CE
0
CLK
CE
1
UB, LB
(4)
DATA
OUT
OE
t
CD2
t
CKLZ
Qn Qn + 1 Qn + 2
t
OHZ
t
OLZ
t
OE
5638 drw 08
(1)
(1)
(1)
(2)
t
SC
t
HC
t
SB
t
HB
t
SW
t
HW
t
SA
t
HA
t
DC
t
SC
t
HC
t
SB
t
HB
(5)
(1 Latency)
(6)
(6)
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. OE is asynchronously controlled; all other inputs are synchronous to the rising clock edge.
3. ADS = V
IL and CNTRST = VIH.
4. The output is disabled (High-Impedance state) by CE
0 = VIH, CE1 = VIL following the next rising edge of the clock. Refer to Truth Table 1.
5. Addresses do not have to be accessed sequentially since ADS = V
IL constantly loads the address on the rising edge of the CLK; numbers
are for reference use only.
6. If UB or LB was HIGH, then the Upper Byte and/or Lower Byte of DATA
OUT for Qn + 2 would be disabled (High-Impedance state).
7. "X' here denotes Left or Right port. The diagram is with respect to that port.

70V9359L7PF

Mfr. #:
Manufacturer:
IDT
Description:
SRAM 8K X 18 SYNC DP SRAM
Lifecycle:
New from this manufacturer.
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