74HC_HCT32 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 6 — 3 December 2015 6 of 16
NXP Semiconductors
74HC32; 74HCT32
Quad 2-input OR gate
10. Dynamic characteristics
[1] t
pd
is the same as t
PHL
and t
PLH
.
[2] t
t
is the same as t
THL
and t
TLH
.
[3] C
PD
is used to determine the dynamic power dissipation (P
D
in W):
P
D
=C
PD
V
CC
2
f
i
N+ (C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of outputs.
Table 7. Dynamic characteristics
GND = 0 V; C
L
= 50 pF; for test circuit see Figure 7.
Symbol Parameter Conditions 25 C 40 C to +125 C Unit
Min Typ Max Max
(85 C)
Max
(125 C)
74HC32
t
pd
propagation delay nA, nB to nY; see Figure 6
[1]
V
CC
= 2.0 V - 22 90 115 135 ns
V
CC
= 4.5 V - 8 18 23 27 ns
V
CC
= 5.0 V; C
L
=15pF - 6 - - - ns
V
CC
= 6.0 V - 6 15 20 23 ns
t
t
transition time see Figure 6
[2]
V
CC
= 2.0 V - 19 75 95 110 ns
V
CC
= 4.5 V - 7 15 19 22 ns
V
CC
= 6.0 V - 6 13 16 19 ns
C
PD
power dissipation
capacitance
per package; V
I
=GNDtoV
CC
[3]
-16- - -pF
74HCT32
t
pd
propagation delay nA, nB to nY; see Figure 6
[1]
V
CC
= 4.5 V - 11 24 30 36 ns
V
CC
= 5.0 V; C
L
=15pF - 9 - - - ns
t
t
transition time V
CC
= 4.5 V; see Figure 6
[2]
- 7 15 19 22 ns
C
PD
power dissipation
capacitance
per package;
V
I
=GNDtoV
CC
1.5 V
[3]
-28- - -pF
74HC_HCT32 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 6 — 3 December 2015 7 of 16
NXP Semiconductors
74HC32; 74HCT32
Quad 2-input OR gate
11. Waveforms
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 6. Input to output propagation delays and output transition times
*1'
9
2+
9
2/
Q<RXWSXW
DDD
9
,
W
3+/
W
7+/
W
7/+
W
3/+
9
<
9
0
9
0
9
;
Q$Q%LQSXW
Table 8. Measurement points
Type Input Output
V
M
V
M
V
X
V
Y
74HC32 0.5V
CC
0.5V
CC
0.1V
CC
0.9V
CC
74HCT32 1.3 V 1.3 V 0.1V
CC
0.9V
CC
74HC_HCT32 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 6 — 3 December 2015 8 of 16
NXP Semiconductors
74HC32; 74HCT32
Quad 2-input OR gate
Test data is given in Table 9.
Definitions test circuit:
R
T
= termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= load capacitance including jig and probe capacitance.
Fig 7. Test circuit for measuring switching times
DDK
W
:
W
:
W
U
W
U
W
I
9
0
9
,
QHJDWLYH
SXOVH
*1'
9
,
SRVLWLYH
SXOVH
*1'




9
0
9
0
9
0
W
I
9
&&
'87
5
7
9
,
9
2
&
/
*
Table 9. Test data
Type Input Load Test
V
I
t
r
, t
f
C
L
74HC32 V
CC
6.0 ns 15 pF, 50 pF t
PLH
, t
PHL
74HCT32 3.0 V 6.0 ns 15 pF, 50 pF t
PLH
, t
PHL

74HCT32DB,118

Mfr. #:
Manufacturer:
Nexperia
Description:
Logic Gates QUAD 2-INPUT OR GATE
Lifecycle:
New from this manufacturer.
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