MC10E131, MC100E131
www.onsemi.com
5
Table 6. 100E SERIES NECL DC CHARACTERISTICS (V
CCx
= 0.0 V; V
EE
= −5.0 V (Note 1))
Symbol Characteristic
−40°C 0°C 25°C 85°C
Unit
Min Typ Max Min Typ Max Min Typ Max Min Typ Max
I
EE
Power Supply Current 58 70 58 70 58 70 67 81 mA
V
OH
Output HIGH Voltage
(Note 2)
−1025 −950 −880 −1025 −950 −880 −1025 −950 −880 mV
V
OL
Output LOW Voltage
(Note 2)
−1810 −1705 −1620 −1810 −1745 −1620 −1810 −1740 −1620 mV
V
IH
Input HIGH Voltage −1025 −1165 −1025 −880 −1165 −1025 −880 −1165 −1025 −880 mV
V
IL
Input LOW Voltage −1645 −1810 −1645 −1475 −1810 −1645 −1475 −1810 −1645 −1475 mV
I
IH
Input HIGH Current
C
C
S
R, CE
D
350
450
300
150
350
450
300
150
350
450
300
150
350
450
300
150
mA
I
IL
Input LOW Current 0.5 0.3 0.5 0.25 0.5 0.2
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. Input and output parameters vary 1:1 with V
CC
. V
EE
can vary −0.46 V / +0.8 V.
2. Outputs are terminated through a 50ĂW resistor to V
CC
− 2.0 V.
Table 7. AC CHARACTERISTICS (V
CCx
= 5.0 V; V
EE
= 0.0 V or V
CCx
= 0.0 V; V
EE
= −5.0 V (Note 1))
Symbol
Characteristic
−40°C 25°C 85°C
Unit
Min Typ Max Min Typ Max Min Typ Max
f
MAX
Maximum Toggle Frequency 1100 1400 1100 1400 1100 1400 MHz
t
PLH
t
PHL
Propagation Delay to Output
CE
C
C
R
S
310
275
400
300
600
600
635
550
750
725
875
775
360
325
450
350
500
500
640
550
700
675
825
725
360
325
450
350
500
500
640
550
700
675
825
725
ps
t
S
Setup Time (Note 2)
D
200 20 150 20 150 20 ps
t
H
Hold Time (Note 2)
D
225 −20 175 −20 175 −20 ps
t
RR
Reset Recovery Time 450 150 400 150 400 150 ps
t
PW
Minimum Pulse Width
CLK
R, S
400
400
400
400
400
400
ps
t
SKEW
Within-Device Skew (Note 3) 60 60 60 ps
t
JITTER
Random Clock Jitter < 1 < 1 < 1 ps
t
r
/t
f
Rise/Fall Time (20−80%) 275 460 725 300 480 300 480 675 ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. 10 Series: V
EE
can vary −0.46 V / +0.06 V.
100 Series: V
EE
can vary −0.46 V / +0.8 V.
2. Setup/hold times guaranteed for both C
C
and CE.
3. Within-device skew is defined as identical transitions on similar paths through a device.
