SIHP5N50D-E3

SiHP5N50D
www.vishay.com
Vishay Siliconix
S16-0109-Rev. B, 25-Jan-16
4
Document Number: 91489
For technical questions, contact: hvm@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Fig. 7 - Typical Source-Drain Diode Forward Voltage
Fig. 8 - Maximum Safe Operating Area
Fig. 9 - Maximum Drain Current vs. Case Temperature
Fig. 10 - Typical Drain-to-Source Voltage vs. Temperature
Fig. 11 - Normalized Thermal Transient Impedance, Junction-to-Case
V
SD
, Source-Drain Voltage (V)
I
SD
, Reverse Drain Current (A)
0.1
1
10
100
0.2 0.4 0.6 0.8 1 1.2 1.4 1.6
T
J
= 150 °C
T
J
= 25 °C
V
GS
= 0 V
V
DS
, Drain-to-Source Voltage (V)
I
D
, Drain Current (A)
0.01
0.1
1
10
100
1 10 100 1000
* V
GS
> minimum V
GS
at which R
DS(on)
is specied
Operation in this area
limited by R
DS(on)
BVDSS Limited
T
C
= 25 °C
T
J
= 150 °C
Single Pulse
Limited by R
DS(on)
*
100 μs
1 ms
10 ms
T
J
, Case Temperature (°C)
I
D
, Drain Current (A)
25 50 75 100 125 150
1
2
3
4
5
6
0
0.01
0.1
1
0.0001 0.001 0.01 0.1 1
Normalized Effective Transient
Thermal Impedance
Pulse Time (s)
Duty Cycle = 0.5
0.1
0.05
Single Pulse
0.2
0.02
SiHP5N50D
www.vishay.com
Vishay Siliconix
S16-0109-Rev. B, 25-Jan-16
5
Document Number: 91489
For technical questions, contact: hvm@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Fig. 12 - Switching Time Test Circuit
Fig. 13 - Switching Time Waveforms
Fig. 14 - Unclamped Inductive Test Circuit
Fig. 15 - Unclamped Inductive Waveforms
Fig. 16 - Basic Gate Charge Waveform
Fig. 17 - Gate Charge Test Circuit
Pulse width 1 µs
Duty factor 0.1 %
R
D
V
GS
R
G
D.U.T.
10 V
+
-
V
DS
V
DD
V
DS
90 %
10 %
V
GS
t
d(on)
t
r
t
d(off)
t
f
R
G
I
AS
0.01 Ω
t
p
D.U.T
L
V
DS
+
-
V
DD
10 V
Vary t
p
to obtain
required I
AS
I
AS
V
DS
V
DD
V
DS
t
p
Q
GS
Q
GD
Q
G
V
G
Charge
10 V
D.U.T.
3 mA
V
GS
V
DS
I
G
I
D
0.3 µF
0.2 µF
50 kΩ
12 V
Current regulator
Current sampling resistors
Same type as D.U.T.
+
-
SiHP5N50D
www.vishay.com
Vishay Siliconix
S16-0109-Rev. B, 25-Jan-16
6
Document Number: 91489
For technical questions, contact: hvm@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Fig. 18 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?91489
.
P.W.
Period
dI/dt
Diode recovery
dV/dt
Ripple 5 %
Body diode forward drop
Re-applied
voltage
Reverse
recovery
current
Body diode forward
current
V
GS
= 10 V
a
I
SD
Driver gate drive
D.U.T. l
SD
waveform
D.U.T. V
DS
waveform
Inductor current
D =
P.W.
Period
+
-
+
+
+
-
-
-
Peak Diode Recovery dV/dt Test Circuit
V
DD
dV/dt controlled by R
g
Driver same type as D.U.T.
I
SD
controlled by duty factor “D”
D.U.T. - device under test
D.U.T.
Circuit layout considerations
Low stray inductance
Ground plane
Low leakage inductance
current transformer
R
g
Note
a. V
GS
= 5 V for logic level devices
V
DD

SIHP5N50D-E3

Mfr. #:
Manufacturer:
Vishay / Siliconix
Description:
MOSFET 500V Vds 30V Vgs TO-220AB
Lifecycle:
New from this manufacturer.
Delivery:
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Payment:
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