Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
7
Rev. C
10/10/06
ISSI
®
IS64WV6416BLL
IS61WV6416BLL
READ CYCLE SWITCHING CHARACTERISTICS
(1)
(Over Operating Range)
-12 ns -15 ns
Symbol Parameter Min. Max. Min. Max. Unit
tRC Read Cycle Time 12 15 ns
tAA Address Access Time 12 15 ns
tOHA Output Hold Time 3 3 ns
tACE CE Access Time 12 15 ns
tDOE OE Access Time 6 7 ns
tHZOE
(2)
OE to High-Z Output 6 0 6 ns
tLZOE
(2)
OE to Low-Z Output 0 0 ns
tHZCE
(2
CE to High-Z Output 0 6 0 6 ns
tLZCE
(2)
CE to Low-Z Output 3 3 ns
tBA LB, UB Access Time 6 7 ns
tHZB LB, UB to High-Z Output 0 6 0 6 ns
tLZB LB, UB to Low-Z Output 0 0 ns
Notes:
1. Test conditions assume signal transition times of 1.5 ns or less, timing reference levels of 1.25V, input pulse levels of 0V to
V
DD V and output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. Not 100% tested.
8
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. C
10/10/06
ISSI
®
IS64WV6416BLL
IS61WV6416BLL
READ CYCLE NO. 2
(1,3)
AC WAVEFORMS
READ CYCLE NO. 1
(1,2)
(Address Controlled) (CS = OE = VIL, UB or LB = VIL)
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE, UB, or LB = V
IL.
3. Address is valid prior to or coincident with CE LOW transition.
t
RC
t
OHA
t
AA
t
DOE
t
LZOE
t
ACE
t
LZCE
t
HZOE
HIGH-Z
DATA VALID
t
HZB
ADDRESS
OE
CE
LB, UB
D
OUT
t
HZCE
t
BA
t
LZB
DATA VALID
PREVIOUS DATA VALID
t
AA
t
OHA
t
OHA
t
RC
D
OUT
ADDRESS
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
9
Rev. C
10/10/06
ISSI
®
IS64WV6416BLL
IS61WV6416BLL
WRITE CYCLE SWITCHING CHARACTERISTICS
(1,2)
(Over Operating Range)
-12 ns -15 ns
Symbol Parameter Min. Max. Min. Max. Unit
tWC Write Cycle Time 12 15 ns
tSCE CE to Write End 9 10 ns
tAW Address Setup Time 9 10 ns
to Write End
tHA Address Hold from Write End 0 0 ns
tSA Address Setup Time 0 0 ns
tPWB LB, UB Valid to End of Write 9 10 ns
tPWE1 WE Pulse Width (OE = HIGH) 9 10 ns
tPWE2 WE Pulse Width (OE = LOW) 11 12 ns
tSD Data Setup to Write End 9 9 ns
tHD Data Hold from Write End 0 0 ns
tHZWE
(3)
WE LOW to High-Z Output 6 7 ns
tLZWE
(3)
WE HIGH to Low-Z Output 3 3 ns
Notes:
1. Test conditions for IS61WV6416BLL assume signal transition times of 1.5ns or less, timing reference levels of 1.25V, input
pulse levels of 0V to VDD V and output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE LOW and UB or LB, and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to
the rising or falling edge of the signal that terminates the write.

IS64WV6416BLL-15TLA3

Mfr. #:
Manufacturer:
ISSI
Description:
SRAM 1Mb 15ns 64Kx16 Async SRAM
Lifecycle:
New from this manufacturer.
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