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2012 ROHM Co., Ltd. All rights reserved.
2012.03 - Rev.I
Data Sheet TCFG Series B Case
Characteristics
Item Performance
Test conditions
(based on JIS C5101-1 and JIS C5101-3)
Operating Temperature
Maximum operating temperature
with no voltage derating
Rated Voltage (V.DC)
16106.34
Category Voltage (V.DC)
106.342.5
Surge Voltage
20
20
13
26
25
16
321385.0
2.5
1.6
3.2
DC leakage current
0.5μA or 0.01CV whichever is greater
(Shown in "Standard list")
As per 4.9 JIS C 5101-1
As per 4.5.1 JIS C 5101-3
As per 4.7 JIS C 5101-1
As per 4.5.2 JIS C 5101-3
As per 4.8 JIS C 5101-1
As per 4.5.3 JIS C 5101-3
As per 4.10 JIS C 5101-1
As per 4.5.4 JIS C 5101-3
As per 4.14 JIS C 5101-1
As per 4.6 JIS C 5101-3
As per 4.16 JIS C 5101-1
As per 4.10 JIS C 5101-3
As per 4.22 JIS C 5101-1
As per 4.12 JIS C 5101-3
Voltage : Rated voltage for 1 min
Capacitance tolerance
Shall be satisfied allowance range.
±20%
Measuring frequency
Measuring voltage
Measuring circuit
Tangent of loss angle
(Df, tanδ)
Impedance
Shall be satisfied the voltage on "Standard list"
Dip in the solder bath
Solder temp
Duration
Repetition
After the specimens, leave it at room temperature
for over 24h and then measure the sample.
Resistance to
soldering heat
There should be no significant abnormality.
The indications should be clear.
Appearance
L.C
Shall be satisfied the voltage on "Standard list"
at 125
°C
at 85°C
at 85°C
+85 °C
: 120±12Hz
: 0.5Vrms, +1.5V.DC
: DC Equivalent series circuit
Measuring frequency
Measuring voltage
Measuring circuit
: 120±12Hz
: 0.5Vrms, +1.5V.DC
: DC Equivalent series circuit
: 100
±10kHz
: 0.5Vrms or less
: DC Equivalent series circuit
Measuring frequency
Measuring voltage
Measuring circuit
: 260
±5°C
: 5±0.5s
: 1
−55 °C to +125 °C
Voltage reduction when temperature exceeds +85°C
Fail-Safe open unit actuation
Within
320
°C
− 20s
Repetition : 5 cycles (1 cycle : steps 1 to 4)
without discontinuation.
Temperature
cycle
There should be no significant abnormality.
Appearance
L.C
ΔC / C
tanδ
ΔC / C
tanδ
Moisture
resistance
Appearance
L.C
There should be no significant abnormality.
The indications should be clear.
Temp. Time
1
Step
2
3
4
Room temp.
Room temp.
3min. or less
3min. or less
30 3min
+
−
30 3min
+
−
−55 3°C
+
−
125 2°C
+
−
ΔC / C
tanδ
After leaving the sample under such atmospheric
condition that the temperature and humidity are
60
±2°C and 90 to 95%RH, respectively, for
500
±12h level it at room temperature for over 24h
and then measure the sample.
Dip in the solder bath
Solder temp : 320
±5°C
After the specimens, leave it at room temperature
for over 24h and then measure the sample.
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than initial limit
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
TCFGB1E475M8R
Others
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
TCFGB1E475M8R
Others
: Within
±
15
% of initial value
: Within
±
15
% of initial value
: Within
±
15
% of initial value
: Within
±
15
% of initial value
: Within
±
10
% of initial value
: Within
±
5
% of initial value
3.3 to 33μF
47 to 150μF
TCFGB0E227M8R
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
TCFGB1C336M8R
: Less than initial limit
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
: Less than initial limit
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
TCFGB1E475M8R
Others
TCFGB0E227M8R
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
Others
: Within
±
15
% of initial value
: Within
±
15
% of initial value
: Within
±
20
% of initial value
: Within
±
20
% of initial value
: Within
±
20
% of initial value
: Within
±
10
% of initial value
3.3 to 33μF
47 to 150μF
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
TCFGB1C336M8R
: Less than initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
: Less than initial limit
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
TCFGB1E475M8R
Others
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
Others
: Within
±
15
% of initial value
: Within
±
20
% of initial value
: Within
±
20
% of initial value
: Within
±
20
% of initial value
: Within
±
10
% of initial value
3.3 to 33μF
47 to 150μF
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A157M8R
TCFGB1A107M8R
TCFGB1C336M8R
: Less than initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
