FXO-HC72 Series
Page 4 of 14
© 2008 FOX ELECTRONICS | ISO9001:2000 Certified
Jitter is frequency dependent. Below are typical values at select frequencies.
Phase Jitter is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; V
DD
=2.5V.
TIE
was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V
DD
= 2.5V.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Phase Jitter & Time Interval Error (TIE)
Frequency
Phase Jitter
(12kHz to 20MHz)
T I E
(Sigma of Jitter Distribution)
Units
62.5 MHz 2.1 3.1 pS RMS
106.25 MHz 1.2 3.5 pS RMS
125 MHz 1.1 2.7 pS RMS
156.25 MHz
0.8
3.7
pS RMS
Random & Deterministic Jitter Composition
Frequency
Random (Rj)
(pS RMS)
Deterministic (Dj)
(pS P-P)
Total Jitter (Tj)
(14 x Rj) + Dj
62.5 MHz 1.3 8.4 27.6 pS
106.25 MHz 1.4 8.3 27.7 pS
125 MHz 1.3 6.7 25.6 pS
156.25 MHz
1.4
9.7
29.5 pS
Phase Noise
10
-160dBc
-140dBc
-150dBc
-130dBc
-120dBc
-110dBc
-90dBc
-80dBc
-100dBc
-50dBc
-70dBc
-60dBc
-20dBc
-30dBc
-40dBc
0 dBc
-10dBc
Data Collected using HP 3048A
1M100k10k100 1k
Offset Frequency (10Hz to 40MHz)
40M10M
62.5 MHz
156.25MHz
(dBc / Hz) vs. offset frequency
2.5V Phase Noise Graphs
Four Frequencies from Jitter Tables
106.25 MHz
125MHz
62.5 MHz
156.25MHz
125MHz
62.5 MHz only to 2 MHz offset Equipment Limitation
