PMBT3904MB_1 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 1 — 7 March 2012 8 of 13
NXP Semiconductors
PMBT3904MB
40 V, 200 mA NPN switching transistor
8. Test information
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
9. Package outline
V
I
= 5 V; t = 600 s; t
p
=10s; t
r
=t
f
3ns
R1 = 56 ; R2 = 2.5 k; R
B
=3.9k; R
C
= 270
V
BB
= 1.9 V; V
CC
=3V
Oscilloscope: input impedance Z
i
=50
Fig 8. Test circuit for switching times
R
C
R2
R1
DUT
mlb826
V
o
R
B
(probe)
450 Ω
(probe)
450 Ω
oscilloscope
oscilloscope
V
BB
V
I
V
CC
Fig 9. Package outline SOT883B
11-11-02Dimensions in mm
2
3
0.55
0.47
0.30
0.22
1
0.40
0.34
0.30
0.22
0.20
0.12
0.65
0.04 max
0.35
0.65
0.55
1.05
0.95