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MX7520TQ/883B

P1-P3
SCOPE: CMOS 10-BIT MULTIPLYING D/A CONVERTER
Device Type Generic Number
01 MX7520S(x)/883B
02 MX7520T(x)/883B
03 MX7520U(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835
Case Outline Package Code
MAXIM
Q GDIP1-T16 or CDIP2-T16 16 LEAD CERDIP J16
E CQCCI-N20 20 LEADLESS CHIP CARRIER L20
Absolute Maximum Ratings
V
DD
to GND ...........................................................................................…. -0.3V, +17V
V
OUT1
,
V
OUT2
, to GND ................................................................................... -0.3V, V
DD
VREF to GND........................................................................................... -25V to +25V
V
RFB
to GND............................................................................................. -25V to +25V
Digital Input Voltage Range ......................................................................... -0.3V,V
DD
Lead Temperature (soldering, 10 seconds) ............................................................. +300°C
Storage Temperature ................................................................................ -65°C to +150°C
Continuous Power Dissipation .......................................................................... T
A
=+70°C
16 pin CERDIP(derate 10mW/°C above +70°C) .................................................... 800mW
20 pin LCC(derate 9.1mW/°C above +70°C) ......................................................... 727mW
Junction Temperature T
J
...................................................................................... +150°C
Thermal Resistance, Junction to Case, ΘJC
16 pin CERDIP.................................................................................................. 40°C/W
20 pin LCC ........................................................................................................ 50°C/W
Thermal Resistance, Junction to Ambient, ΘJA:
16 pin CERDIP.................................................................................................. 20°C/W
20 pin LCC ..................................................................................................... 110°C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) ............................................................. -55°C to +125°C
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
---------------------------- Electrical Characteristics of MX7520/883B 19-1025 Rev. B
Page 2 of 5
TABLE 1. ELECTRICAL TESTS:
TEST Symbol
CONDITIONS
-55 °C <=T
A
<= +125°C 1/
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
Resolution RES NOTE 2
All
10 Bits
Relative Accuracy RA
1,2,3 01
02
03
-2.0
-1.0
-0.5
+2.0
-1.0
0.5
LSB
Nonlinearity Tempco TC
NL
NOTE 2
All
-2.0 +2.0
ppm/°C
Gain Tempco TC
AE
NOTE 2
All
-20 +20
ppm/°C
OUT1 Leakage Current I
OUT1
Digital inputs at V
IL
,
VREF=+10V
1,2,3
All
-200 200 nA
OUT2 Leakage Current I
OUT2
Digital inputs at V
IH
,
VREF=+10V
1,2,3
All
-200 200 nA
Output Current Settling
Time
NOTE 2
To ±0.5LSB, OUT1 load is
100Ω13pF. Digital inputs = V
IH
to V
IL
or V
IL
to V
IH
.
4
All
0.5
µs
Feedthrough Error
NOTE 3
FTE VREF=20Vp-p at 10kHz sine
wave, digital inputs at V
IL
430mVp-p
Reference Input Resistance R
IN
1,2,3
All
520
kΩ
Input High Level Voltage V
IH
1,2,3
All
2.4 V
Input Low Level Voltage V
IL
1,2,3
All
0.8 V
Input Leakage Current I
IL
V
IN
=0V or V
DD
1,2,3
All
-1.0 1.0
µA
Output Capacitance
C
OUT1
C
OUT2
Digital Inputs at V
IH
Digital Inputs at V
IL
Digital Inputs at V
IH
Digital Inputs at V
IL
4
All
120
37
37
120
pF
Supply Current I
DD
Digital Inputs at V
IH
or V
IL
1,2,3
All
2mA
NOTE 1: V
DD
=+15V, V
OUT1
=V
OUT2
=0V, VREF=+10V, unless otherwise specified.
NOTE 2: Characteristics supplied for use as a typical design limit but not production tested.
NOTE 3: Feedthrough error can be reduced by connecting the lid of the ceramic SB package to ground.
TERMINAL CONNECTIONS
J16, D16 20 LCC J16, D16 20 LCC
1 OUT1 NC 11 D8 NC
2 OUT2 OUT1 12 D9 D6
3 GND OUT2 13 D10(LSB) D7
4 D1(MSB) GND 14 V
DD
D8
5 D2 D1(MSB) 15 VREF D9
6D3 NC 16R
FB
NC
7 D4 D2 17 D10(LSB)
8D5 D3 18 V
DD
9D6 D4 19 VREF
10 D7 D5 20 R
FB
---------------------------- Electrical Characteristics of MX7520/883B 19-1025 Rev. B
Page 3 of 5
Package ORDERING INFORMATION:
01 16 pin CERDIP MX7520SQ/883B
01 20 pin LCC MX7520SE/883B
02 16 pin CERDIP MX7520TQ/883B
02 20 pin LCC MX7520TE/883B
03 16 pin CERDIP MX7520UQ/883B
03 20 pin LCC MX7520UE/883B
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004
1
Final Electrical Parameters
Method 5005
1*, 2, 3, 4**
Group A Test Requirements
Method 5005
1, 2, 3, 4**
Group C and D End-Point Electrical Parameters
Method 5005
1
* PDA applies to Subgroup 1 only.
** Subgroup 4, Capacitance tests are performed at initial qual and upon redesign.
Sample size will be 116 units.
---------------------------- Electrical Characteristics of MX7520/883B 19-1025 Rev. B
Page 4 of 5
P1-P3

MX7520TQ/883B

Mfr. #:
Buy MX7520TQ/883B
Manufacturer:
Maxim Integrated
Description:
Digital to Analog Converters - DAC 10-Bit Precision DAC
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