9/6/02
Page 4 of 14
© 2002 Fairchild Semiconductor Corporation
OPTICALLY ISOLATED
ERROR AMPLIFIER
FOD2711
Notes
1. Device is considered as a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are shorted together.
2. Common mode transient immunity at output high is the maximum tolerable (positive) dVcm/dt on the leading edge of the
common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient immunity at output low
is the maximum tolerable (negative) dVcm/dt on the trailing edge of the common pulse signal,Vcm, to assure that the output will
remain low.
OUTPUT CHARACTERISTICS
(T
A
= 25°C Unless otherwise specied.)
Parameter Test Conditions Symbol Min Typ Max Unit
Collector dark current (V
CE
= 10 V) (Fig. 5) I
CEO
50 nA
Emitter-collector voltage breakdown (I
E
= 100 µA) BV
ECO
7V
Collector-emitter voltage breakdown (I
C
= 1.0mA) BV
CEO
70 V
TRANSFER CHARACTERISTICS
(T
A
= 25°C Unless otherwise specied.)
Parameter Test Conditions Symbol Min Typ Max Unit
Current transfer ratio
(I
LED
= 10 mA, V
COMP
= V
FB
,
V
CE
= 5 V) (Fig. 6)
CTR 100 200 %
Collector-emitter
saturation voltage
(I
LED
= 10 mA, V
COMP
= V
FB
,
I
C
= 2.5 mA) (Fig. 6)
V
CE
(SAT)
0.4 V
ISOLATION CHARACTERISTICS
(T
A
= 25°C Unless otherwise specied.)
Parameter Test Conditions Symbol Min Typ Max Unit
Input-output insulation
leakage current
(RH = 45%, T
A
= 25°C, t = 5s,
V
I-O
= 3000 VDC) (note. 1)
I
I-O
1.0 µA
Withstand insulation
voltage
(RH <= 50%, T
A
= 25°C, t = 1 min)
(note 1)
V
ISO
5000 Vrms
Resistance (input to output) V
I-O
= 500 VDC (note. 1) R
I-O
10
12
Ohm
SWITCHING CHARACTERISTICS (T
A
= 25°C Unless otherwise specied.)
Parameter Test Conditions Symbol Min Typ Max Unit
Bandwidth (Fig. 7) B
W
10 kHZ
Common mode transient
immunity at output high
(I
LED
= 0 mA, V
cm
= 10 V
PP
RL = 2.2 k (Fig. 8) (note 2)
CMH 1.0 kV/µs
Common mode transient
immunity at output low
(I
LED
= 10 mA, V
cm
= 10 V
PP
RL = 2.2 k (Fig. 8) (note 2)
CML 1.0 kV/µs
9/6/02
Page 5 of 14
© 2002 Fairchild Semiconductor Corporation
OPTICALLY ISOLATED
ERROR AMPLIFIER
FOD2711
I
(LED)
V
(LED)
V
COMP
V
COMP
I
CEO
V
CE
V
REF
V
CE
I
(LED)
V
F
V
REF
V
REF
82
3
2
3
V
V
V
6
7
5
I
(LED)
I
(LED)
I
C
I
(OFF)
I
REF
8
6
2
3
2
3
2
3
V
V
7
5
8
6
7
5
8
6
7
5
8
6
2
3
7
5
R1
8
6R1
R2
7
5
FIG. 1. V
REF
, V
F,
I
LED
(min) TEST CIRCUIT
FIG. 3. I
REF
TEST CIRCUIT
FIG. 5. I
CEO
TEST CIRCUIT FIG. 6. CTR, V
CE(sat)
TEST CIRCUIT
FIG. 4. I
(OFF)
TEST CIRCUIT
FIG. 2. V
REF/
V
COMP
TEST CIRCUIT
9/6/02
Page 6 of 14
© 2002 Fairchild Semiconductor Corporation
OPTICALLY ISOLATED
ERROR AMPLIFIER
FOD2711
3
2
1
4
8
7
6
A
B
5
3
4
2
1
6
5
7
8
V
CC
= +5V DC
V
CC
= +5V DC
I
F
= 10 mA
I
F
= 0 mA (A)
I
F
= 10 mA (B)
V
IN
0.47V
0.1 V
PP
47
V
OUT
V
OUT
VCM
10V
P-P
R1
2.2k
R
L
1µf
+
_
+
+
_
_
Fig. 7 Frequency Response Test Circuit
Fig. 8 CMH and CML Test Circuit

FOD2711SDV

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
OPTOISOLATOR 5KV TRANSISTOR 8SMD
Lifecycle:
New from this manufacturer.
Delivery:
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