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CSX750VCB19.440M-UT

P1-P3P4-P6P7-P9P10-P10
SPECIFICATION
NO.
PAGE
DATE
4/10
6. TEST CIRCUIT
[CMOS LOAD] (30pF)
[SUPPLY CURRENT]
Vdd
Vdd
Test Point
6 5 4
6 5 4
Vdd OE OUT
Vdd OE OUT
.01 to
CL=
.01 to
0.1uF
Vc GND
30pF
0.1uF
Vc GND
1 2 3
1 2 3
1.65V
1.65V
GND
GND
[MEASUREMENT CONDITION]
1.Osilloscope
Impedance:No less than 1Mohm
Capacitance:No more than 5pF
Band width:No less than 500MHz
The length of GND lead of the probe should be as short as possible.
2.The CL includes the probe capacitance.
3.Grounding should be single point grounding.
4.Supply impedance should be as low as possible.
0V to 90%Vdd rise time is no less than 150us
5.Use the ammeter that internal impedance is small.
7. OUTPUT WAVEFORM
[CMOS LOAD] (30pF)
tf
tr
80%Vdd
50%Vdd
20%Vdd
Th
T
DUTY=Th/T
SPECIFICATION
NO.
PAGE
DATE
5/10
8. ENVIRONMENTAL AND MECHANICAL CHARACTERISTICS
The following are our reliability test conditions.
Item Conditions
Shock MIL-STD-883E 2002.3B
Vibration MIL-STD-883E 2007.2A
Gross Leak Leak rate less than 50ppm atm cc /sec of Air
Fine Leak Leak rate less than 0.01ppm atm cc /sec of Herium
SPECIFICATION
NO.
PAGE
DATE
6/10
III.
DIMENSIONS AND MARKING
<<Dimensions>> (UNIT mm)
32.7680
017105
CTZ VBBL
Manufucturer's Name
Frequency
Type
Production Lot Number
P1-P3P4-P6P7-P9P10-P10

CSX750VCB19.440M-UT

Mfr. #:
Buy CSX750VCB19.440M-UT
Manufacturer:
Description:
XTAL OSC VCXO 19.4400MHZ CMOS
Lifecycle:
New from this manufacturer.
Delivery:
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