110 PHT-ST
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Document Number: 28411
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Table 5
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
TEST PROCEDURES AND REQUIREMENTS
TEST
PROCEDURE
(quick reference)
REQUIREMENTS
NAME OF TEST REFERENCE
Endurance
IEC 60384-4 /
EN130300
subclause 4.13
T
amb
= 85 C; U
R
applied;
2000 h
C/C: ± 10 %
tan 1.3 x spec. limit
Z 2 x spec. limit
I
L5
spec. limit
Useful life
CECC 30301
subclause 1.8.1
T
amb
= 85 C; U
R
and I
R
applied
C/C: ± 30 %
tan 3 x spec. limit
Z 3 x spec. limit
I
L5
spec. limit
no short or open circuit,
no visible damage
Total failure percentage:
3 %
Shelf life
(storage at
high temperature)
IEC 60384-4 /
EN130300
subclause 4.17
T
amb
= 85 C; no voltage applied;
500 h
after test: U
R
to be applied for 30 min,
24 h to 48 h before measurement
C/C: ±10 %
tan 1.2 x spec. limit
I
L5
2 x spec. limit