©2002 Fairchild Semiconductor Corporation FDH27N50 Rev. A2
FDH27N50
Package Marking and Ordering Information
Electrical Characteristics
Tc = 25°C (unless otherwise noted)
Statics
Dynamics
Avalanche Characteristics
Drain-Source Diode Characteristics
Notes:
1: Repetitive rating; pulse width limited by maximum junction temperature
2: Starting T
J
= 25°C, L = 7mH, I
AS
= 27A
Device Marking Device Package Reel Size Tape Width Quantity
FDH27N50 FDH27N50 TO-247 Tube - 30
Symbol Parameter Test Conditions Min Typ Max Units
B
VDSS
Drain to Source Breakdown Voltage I
D
= 250µA, V
GS
= 0V 500 - - V
∆B
VDSS
/∆T
J
Breakdown Voltage Temp. Coefficient
Reference to 25
o
C
I
D
= 1mA
-0.64-V/°C
r
DS(ON)
Drain to Source On-Resistance V
GS
= 10V, I
D
= 13.5A - 0.17 0.19 Ω
V
GS(th)
Gate Threshold Voltage V
DS
= V
GS
, I
D
= 250µA2.03.34.0V
I
DSS
Zero Gate Voltage Drain Current
V
DS
= 500V T
C
=25
o
C- - 25
µA
V
GS
= 0V T
C
= 150
o
C- - 250
I
GSS
Gate to Source Leakage Current V
GS
= ±30V - - ±100 nA
g
fs
Forward Transconductance V
DS
= 50V, I
D
= 13.5A 11 - - S
Q
g(TOT)
Total Gate Charge at 10V
V
GS
= 10V
V
DS
= 400V
I
D
= 27A
-5667nC
Q
gs
Gate to Source Gate Charge - 17 20 nC
Q
gd
Gate to Drain “Miller” Charge - 18 22 nC
t
d(ON)
Turn-On Delay Time
V
DD
= 250V
I
D
= 27A
R
G
= 4.3Ω
R
D
= 9.3Ω
-14-ns
t
r
Rise Time - 54 - ns
t
d(OFF)
Turn-Off Delay Time - 47 - ns
t
f
Fall Time - 54 - ns
C
ISS
Input Capacitance
V
DS
= 25V, V
GS
= 0V
f = 1MHz
-3550- pF
C
OSS
Output Capacitance - 409 - pF
C
RSS
Reverse Transfer Capacitance - 22 - pF
E
AS
Single Pulse Avalanche Energy (Note 2) 2552 - - mJ
I
AR
Avalanche Current - - 27 A
I
S
Continuous Source Current
(Body Diode)
MOSFET symbol
showing the
integral reverse
p-n junction diode.
--27A
I
SM
Pulsed Source Current
(Note 1)
(Body Diode)
- - 108 A
V
SD
Source to Drain Diode Voltage I
SD
= 27A - 0.89 1.2 V
t
rr
Reverse Recovery Time I
SD
= 27A, dI
SD
/dt = 100A/µs - 563 714 ns
Q
RR
Reverse Recovered Charge I
SD
= 27A, dI
SD
/dt = 100A/µs- 9.2 14 µC
D
G
S