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74HCT4016D,112

P1-P3P4-P6P7-P9P10-P12P13-P14
December 1990 7
Philips Semiconductors Product specification
Quad bilateral switches 74HC/HCT4016
Fig.8 Test circuit for measuring ON-state current.
Fig.9 Typical R
ON
as a function of input voltage V
is
for V
is
= 0 to V
CC
.
December 1990 8
Philips Semiconductors Product specification
Quad bilateral switches 74HC/HCT4016
DC CHARACTERISTICS FOR 74HC
Voltages are referenced to GND (ground = 0 V)
AC CHARACTERISTICS FOR 74HC
GND = 0 V; t
r
=t
f
= 6 ns; C
L
= 50 pF
SYMBOL PARAMETER
T
amb
(°C)
UNIT
TEST CONDITIONS
74HC
V
CC
(V)
V
I
OTHER
+25 −40 to +85 −40 to +125
min. typ. max. min. max. min. max.
V
IH
HIGH level input
voltage
1.5
3.15
4.2
6.3
1.2
2.4
3.2
4.3
1.5
3.15
4.2
6.3
1.5
3.15
4.2
6.3
V 2.0
4.5
6.0
9.0
V
IL
LOW level input
voltage
0.8
2.1
2.8
4.3
0.50
1.35
1.80
2.70
0.50
1.35
1.80
2.70
0.50
1.35
1.80
2.70
V 2.0
4.5
6.0
9.0
±I
I
input leakage
current
0.1
0.2
1.0
2.0
1.0
2.0
µA 6.0
10.0
V
CC
or
GND
±I
S
analog switch
OFF-state current
per channel
0.1 1.0 1.0 µA 10.0 V
IH
or
V
IL
V
S
=
V
CC
− GND
(see Fig.7)
±I
S
analog switch
ON-state current
0.1 1.0 1.0 µA 10.0 V
IH
or
V
IL
V
S
=
V
CC
− GND
(see Fig.8)
I
CC
quiescent supply
current
2.0
4.0
20.0
40.0
40.0
80.0
µA 6.0
10.0
V
CC
or
GND
V
is
= GND or
V
CC
;V
os
=
V
CC
or GND
SYMBOL PARAMETER
T
amb
(°C)
UNIT
TEST CONDITIONS
74HC
V
CC
(V)
OTHER
+25 −40 to +85 −40 to +125
min. typ. max. min. max. min. max.
t
PHL
/ t
PLH
propagation
delay
V
is
to V
os
17
6
5
4
60
12
10
8
75
15
13
10
90
18
15
12
ns 2.0
4.5
6.0
9.0
R
L
= ∞;C
L
= 50 pF
(see Fig.16)
t
PZH
/ t
PZL
turn “ON” time
E
n
to V
os
52
19
15
11
190
38
32
28
240
48
41
35
235
57
48
42
ns 2.0
4.5
6.0
9.0
R
L
=1 kΩ;C
L
= 50 pF
(see Figs 17 and 18)
t
PHZ
/ t
PLZ
turn “OFF” time
E
n
to V
os
47
17
14
13
145
29
25
22
180
36
31
28
220
44
38
33
ns 2.0
4.5
6.0
9.0
R
L
=1 kΩ;C
L
= 50 pF
(see Figs 17 and 18)
December 1990 9
Philips Semiconductors Product specification
Quad bilateral switches 74HC/HCT4016
DC CHARACTERISTICS FOR 74HCT
Voltages are referenced to GND (ground = 0 V)
Note
1. The value of additional quiescent supply current (∆I
CC
) for a unit load of 1 is given here.
To determine ∆I
CC
per input, multiply this value by the unit load coefficient shown in the table below.
SYMBOL PARAMETER
T
amb
(°C)
UNIT
TEST CONDITIONS
74HCT
V
CC
(V)
V
I
OTHER
+25 −40 to +85 −40 to +125
min. typ. max. min. max. min. max.
V
IH
HIGH level input
voltage
2.0 1.6 2.0 2.0 V 4.5
to
5.5
V
IL
LOW level input
voltage
1.2 0.8 0.8 0.8 V 4.5
to
5.5
±I
I
input leakage
current
0.1 1.0 1.0 µA 5.5 V
CC
or
GND
±I
S
analog switch
OFF-state current
per channel
0.1 1.0 1.0 µA 5.5 V
IH
or
V
IL
V
S
=
V
CC
− GND
(see Fig.7)
±I
S
analog switch
ON-state current
0.1 1.0 1.0 µA 5.5 V
IH
or
V
IL
V
S
=
V
CC
− GND
(see Fig.8)
I
CC
quiescent supply
current
2.0 20.0 40.0 µA 4.5
to
5.5
V
CC
or
GND
V
is
= GND or
V
CC
;V
os
=
V
CC
or GND
∆I
CC
additional quiescent
supply current per
input pin for unit
load coefficient is 1
(note 1)
100 360 450 490 µA 4.5
to
5.5
V
CC
−2.1V
other inputs
at V
CC
or
GND
INPUT UNIT LOAD COEFFICIENT
E
N
1.00
P1-P3P4-P6P7-P9P10-P12P13-P14

74HCT4016D,112

Mfr. #:
Buy 74HCT4016D,112
Manufacturer:
NXP Semiconductors
Description:
Analog Switch ICs QUAD BILATERAL
Lifecycle:
New from this manufacturer.
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